Tilt extraction of scanning Fabry-Pérot interferometer for solar telescope

Chengmiao Liu; Jianxin Li; Yusheng Sun; Rihong Zhu

doi:10.1117/12.2072246

18 November 2014 Tilt extraction of scanning Fabry-Pérot interferometer for solar telescope

Chengmiao Liu, Jianxin Li, Yusheng Sun, Rihong Zhu

Author Affiliations +

Proceedings Volume 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics; 92981W (2014) https://doi.org/10.1117/12.2072246
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China

Abstract

Tunable Fabry–Pérot (F-P) based narrow band filter has been widely used in large solar telescope, which is utilized to isolate an arbitrary wavelength that we are interested in by adjusting the cavity length. However, it is difficult to guarantee that the mirror scan strictly parallel. As a result, the observations of the solar telescope would be affected. Here, we proposed a method to extract the tilt information of the scanning mirror. At first, the interferogram is obtained on the outer surface of the F-P interferometer. Then an interferogram of double-path is obtained from the multi-beam fringe pattern, which contains the tilt information of the moving mirror. Finally, the Radon transform is used in processing the interferogram to extract the tilted plane. Good results come out of the simulation of this method. It has high accuracy and high stability. It can provide feedback information to the closed-loop control system, and guide the tilt correction.

Citation Download Citation

Chengmiao Liu, Jianxin Li, Yusheng Sun, and Rihong Zhu "Tilt extraction of scanning Fabry-Pérot interferometer for solar telescope", Proc. SPIE 9298, International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics, 92981W (18 November 2014); https://doi.org/10.1117/12.2072246

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KEYWORDS

Mirrors

Interferometers

Solar telescopes

Radon transform

Fringe analysis

Control systems

Image processing

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