Paper
6 March 2015 Measurement of the spectral characteristics and color parameters of flat objects
Author Affiliations +
Proceedings Volume 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation; 94460J (2015) https://doi.org/10.1117/12.2087272
Event: International Symposium on Precision Engineering Measurement and Instrumentation, 2014, Changsha/Zhangjiajie, China
Abstract
Quality control of different coatings (colorful, paint, marker, safety, etc.) that are applied to the surface of various objects (both metallic and non-metallic) is an important problem. Also, there is a problem of dealing with counterfeit products. So it’s necessary to distinguish the fake replicas of marking from the authentic marking of producer. To solve these problems, we propose an automated device (hardware and software complex) for analysis and control of spectral reflection characteristics, albedo and color parameters of extended (up to 150 mm × 150 mm) flat objects. It allows constructing the color image of the object surface as well as its multispectral images in selected regions of the spectrum. Herewith the color of the object surface can be calculated for various standard light sources (A, B, C, D65, E, F2, F7, F11, GE), or to any light source with a predetermined emission spectrum. The paper presents the description of construction and working principles of the proposed hardware and software complex. All color settings calculations correspond to the requirements and recommendations of CIE.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elena V. Gorbunova, Aleksandr N. Chertov, Elena A. Lastovskaia, Valery V. Korotaev, and Vadim E. Norko "Measurement of the spectral characteristics and color parameters of flat objects", Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460J (6 March 2015); https://doi.org/10.1117/12.2087272
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Reflection

Multispectral imaging

Reflectivity

Light sources

Calibration

Control systems

Data processing

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