Open Access Paper
15 September 2015 Front Matter: Volume 9575
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9575 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in Optical Manufacturing and Testing XI, edited by Oliver W. Fähnle, Ray Williamson, Dae Wook Kim, Proceedings of SPIE Vol. 9575 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 996-756X (electronic)

ISBN: 9781628417418

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abou-El-Hossein, Khaled, 09, 0A, 19

Allen, Richard G., 0Q

Amon, John N., 04

Asfour, Jean-Michel, 16

Atkinson, Charles B., 04

Audo, F., 1A

Avendaño-Alejo, Maximino, 1G, 1H

Bibby, Matt, 0B

Biskup, H., 0O, 12

Blalock, Todd, 0H

Boffa, Christopher C., 0M

Bouillet, S., 1A

Broccolo, Ronald T., 04

Burge, James H., 0W, 15

Castán-Ricaño, Diana, 1G, 1H

Castillo-Santiago, Gabriel, 1H

Chen, Yi-Chun, 0X

Cheng, Yuan-Chieh, 09, 19

Chiang, Hou-Chi, 14

Cumme, M., 12

Cureton, Kevin, 0M

Daly, Elizabeth A., 04

Dambon, Olaf, 0R

Daurios, J., 1A

DeGroote Nelson, Jessica, 0H

DelOlmo-Márquez, Jesús, 1G

Densmore, Victor, 06

Díaz-Uribe, Rufino, 1G, 1H

Dietzel, Andreas, 02

Doetz, Marius, 0R

Dun, Aihuan, 0S

Dunn, Christina, 0B

Effinger, Michael R., 0L

Egerman, Robert, 0L

Ellis, James M., 04

Eng, Ron, 0L

Eupherte, L., 1A

Fähnle, Oliver, 0R, 12

Fechner, R., 12

Feinberg, Lee D., 04, 05

Ferland, Albert, 0L

Fréville, S., 1A

Frost, F., 12

Gao, Weichuan, 06

Gao, Wenlan, 0P, 0S

Gozález-Galindo, Alfredo, 1H

Gray, Caroline, 08

Gu, Haojin, 0D

Haberl, A., 0O

Hadaway, James B., 05

Hahn, Walter G., 04

Han, Jeong-Yeol, 0N

Havey, Keith A., Jr., 05

Hong, Meijuan, 0S

Hooper, Abigail R., 0M

Hsu, Wei-Yao, 09, 19

Hu, Chen, 0D

Hu, Haixiang, 0C

Huang, Run, 15

Huang, Ting-Wei, 14

Hubler, William H., 0Q

Huguet, Jesse A., 05

Johnson, Matthew, 0L

Jota, Thiago S., 06

Kennard, Scott H., 04

Keski-Kuha, Ritva, 04, 05

Keyes, Derek S., 06

Kim, Gun-Hee, 06

Kim, Sug-Whan, 0N

Kim, Young-Sik, 06

Klocke, Fritz, 0R

Kuo, Ching-Hsiang, 19

Lander, Juli A., 05

Langenbach, E., 12

Leber, Ingmar, 02

Lee, Haengbok, 0N

Lee, Kyungmook, 0N

Levi, Joshua, 04

Li, Hongyu, 0B

Lin, Po-Chih, 0X

Liu, Shijie, 0D, 0P, 0S

Lo, Weng-Hou, 0X

Lu, Chunlian, 0B

Luepke, Dakota, 06

Lunt, Sharon, 05

Mang, Ou-Yang, 14

Marsh, James M., 05

Matthews, Gary W., 04, 05, 0L

McKay, Andrew, 04

Medicus, Kate, 0H

Mikš, A., 1C

Milster, Thomas D., 06

Mitchell, John B., 16

Mkoko, Z., 09, 0A

Mlynarska, Paulina, 1D

Mt. Pleasant, Stephen M., 04

Nasyrov, Ruslan K., 16

Niesel, Thalke, 02

Noël, Darin M., 05

Novák, J., 1C

Novák, P., 1C

Otieno, Timothy, 09, 19

Pakuła, Anna, 1D

Pokorný, P., 1C

Poleshchuk, Alexander G., 16

Rascher, R., 0O, 12

Rees, Paul C. T., 08, 16

Rouyer, C., 1A

Salbut, Leszek, 1D

Sarkas, Harry W., 0M

Schindler, A., 12

Scorse, Thomas R., 05

Seo, Hyunju, 0N

Seong, Sehyun, 0N

Shao, Jianda, 0D, 0P, 0S

Sloma, Marcin, 1D

Smith, Greg A., 0W

Spina, John A., 05

Stahl, H. Philip, 0L

Stahl, Mark T., 0J

Stover, John C., 11

Su, Peng, 15

Texter, Scott, 04

Tomczewski, Slawomir, 1D

Tsai, Yu-Hsiang, 14

Volkov, Andy, 16

Voyton, Mark F., 05

Walker, Chanda B., 05

Walker, David, 0B

Wei, Chaoyang, 0D, 0P, 0S

Weidner, Frank, 16

Wells, Conrad, 05

Whitman, Tony L., 05

Wróblewski, Grzegorz, 1D

Wu, Hsing Yu, 0B

Wünsche, C., 12

Xu, Jiafeng, 0P

Xu, Xueke, 0D, 0P, 0S

Yan, Yung-Jhe, 14

Yang, Minghong, 0P, 0S

Yoon, Siyoung, 0N

Yu, Guoyu, 0B

Zeng, Xuefeng, 0C

Zhang, Haichao, 0D

Zhang, Xuejun, 0C

Zhang, Yang, 0S

Zhang, Yizhong, 0D

Zheng, Ligong, 0C

Zheng, Xiao, 0B

Zygalsky, F., 12

Conference Committee

Program Track Chair

  • H. Philip Stahl, NASA Marshall Space Flight Center (United States)

Conference Chairs

  • Oliver W. Fähnle, FISBA OPTIK AG (Switzerland)

  • Ray Williamson, Ray Williamson Consulting (United States)

  • Dae Wook Kim, College of Optical Sciences, The University of Arizona (United States)

Conference Program Committee

  • Haobo Cheng, Tsinghua University (China)

  • Olaf Dambon, Fraunhofer-Institut für Produktionstechnologie (Germany)

  • Peter J. de Groot, Zygo Corporation (United States)

  • Jessica E. DeGroote Nelson, Optimax Systems, Inc. (United States)

  • Richard R. Freeman, Zeeko Ltd. (United Kingdom)

  • Roland Geyl, Sagem Défense Sécurité (France)

  • John E. Greivenkamp, College of Optical Sciences, The University of Arizona (United States)

  • Steve E. Kendrick, Ball Aerospace & Technologies Corporation (United States)

  • Sugwhan Kim, Yonsei University (Korea, Republic of)

  • Sven R. Kiontke, asphericon GmbH (Germany)

  • Cody B. Kreischer, Kreischer Optics, Ltd. (United States)

  • Gary W. Matthews, Exelis Visual Information Solutions (United States)

  • Robert E. Parks, Optical Perspectives Group, LLC (United States)

  • Rolf Rascher, Hochschule Deggendorf (Germany)

  • Joseph L. Robichaud, L-3 Communications SSG-Tinsley (United States)

  • Joanna Schmit, Bruker Corporation (United States)

  • Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Shai N. Shafrir, Corning Incorporated (United States)

  • Tayyab I. Suratwala, Lawrence Livermore National Laboratory (United States)

  • Flemming Tinker, Aperture Optical Sciences Inc. (United States)

  • Martin J. Valente, College of Optical Sciences, The University of Arizona (United States)

  • David D. Walker, Zeeko Research Ltd. (United Kingdom)

  • Konrad Wegener, ETH Zürich (Switzerland)

  • Christine Wünsche, Hochschule Deggendorf (Germany)

  • Takashi Yatsui, The University of Tokyo (Japan)

  • Xue-jun Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)

Session Chairs

  • 1 Optical Systems I

    Dae Wook Kim, College of Optical Sciences, The University of Arizona (United States)

  • 2 Optical Systems II

    Ray Williamson, Ray Williamson Consulting (United States)

  • 3 Optical Manufacturing I

    Oliver W. Fähnle, FISBA OPTIK AG (Switzerland)

  • 4 Optical Manufacturing II

    Jessica DeGroote Nelson, Optimax Systems, Inc. (United States)

  • 5 Optical Manufacturing III

    Martin J. Valente, Arizona Optical Systems, LLC (United States)

  • 6 Optical Manufacturing IV

    David D. Walker, Zeeko Research Ltd. (United Kingdom)

  • 7 Optical Testing I

    Ray Williamson, Ray Williamson Consulting (United States)

  • 8 Optical Testing II

    Xue-jun Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)

  • 9 Optical Testing III

    Ray Williamson, Ray Williamson Consulting (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9575", Proc. SPIE 9575, Optical Manufacturing and Testing XI, 957501 (15 September 2015); https://doi.org/10.1117/12.2208522
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KEYWORDS
Optics manufacturing

Geometrical optics

Optical testing

Visual optics

Freeform optics

Integrated optics

Mirrors

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