A BRDF Measurement Apparatus For Cryogenically Cooled Samples

R C Sullivan; B W Murray; S R Henion; G T Stribley

doi:10.1117/12.948098

5 April 1989 A BRDF Measurement Apparatus For Cryogenically Cooled Samples

R C Sullivan, B W Murray, S R Henion, G T Stribley

Proceedings Volume 0967, Stray Light and Contamination in Optical Systems; (1989) https://doi.org/10.1117/12.948098
Event: 32nd Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1988, San Diego, CA, United States

Abstract

A unique scatterometer and radiation facility has been developed to measure the BRDF at l0.6 μmt of mirror samples cooled to 20°K before and after electron beam irradiation. This paper will describe the facility and present some typical data.

Citation Download Citation

R C Sullivan, B W Murray, S R Henion, and G T Stribley "A BRDF Measurement Apparatus For Cryogenically Cooled Samples", Proc. SPIE 0967, Stray Light and Contamination in Optical Systems, (5 April 1989); https://doi.org/10.1117/12.948098

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