Active thermal NDT: problems and solutions

V. P. Vavilov

doi:10.1117/12.2222980

11 May 2016 Active thermal NDT: problems and solutions

V. P. Vavilov

Proceedings Volume 9861, Thermosense: Thermal Infrared Applications XXXVIII; 98610I (2016) https://doi.org/10.1117/12.2222980
Event: SPIE Commercial + Scientific Sensing and Imaging, 2016, Baltimore, MD, United States

Abstract

This paper summarizes some common problems of thermal/infrared nondestructive testing and their possible solutions, including optimization of heat source and infrared imager parameters, suppression of additive and multiplicative noise and the use of inversion expressions for estimating defect parameters.

Citation Download Citation

V. P. Vavilov "Active thermal NDT: problems and solutions", Proc. SPIE 9861, Thermosense: Thermal Infrared Applications XXXVIII, 98610I (11 May 2016); https://doi.org/10.1117/12.2222980

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available