Presentation
28 April 2022 Multi-plane 3D optical voltage imaging using high-speed multi-Z confocal microscopy
Author Affiliations +
Proceedings Volume PC11946, Neural Imaging and Sensing 2022; PC1194606 (2022) https://doi.org/10.1117/12.2607867
Event: SPIE BiOS, 2022, San Francisco, California, United States
Abstract
Fluorescent genetically encoded voltage indicators can be combined with optical imaging to provide high-throughput electrophysiologic recordings with single-spike resolution and subthreshold sensitivity. Such voltage imaging is highly demanding in terms of signal collection; thus, most experiments have been performed with widefield one-photon microscopy. Unfortunately, widefield techniques are susceptible to out-of-focus background and scattering, which degrades SNR, especially in high-density slice or in vivo experiments. In this work, we describe a multi-plane near-kHz-rate confocal microscope that effectively suppresses undesired background. This technique enables more densely labeled in vitro and in vivo imaging experiments, critical for the dissection of neural circuit dynamics.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy D. Weber, Maria V. Moya, Michael N. Economo, and Jerome Mertz "Multi-plane 3D optical voltage imaging using high-speed multi-Z confocal microscopy", Proc. SPIE PC11946, Neural Imaging and Sensing 2022, PC1194606 (28 April 2022); https://doi.org/10.1117/12.2607867
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KEYWORDS
Confocal microscopy

Optical imaging

3D image processing

Stereoscopy

In vivo imaging

In vitro testing

Microscopes

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