In-situ electrical and electrochemical characteristic measurement using AFM in high temperature

Suhan Lee; Yong-Jin Yoon; Chee Seng Ng

doi:10.1117/12.2632906

3 October 2022 In-situ electrical and electrochemical characteristic measurement using AFM in high temperature

Suhan Lee, Yong-Jin Yoon, Chee Seng Ng

Proceedings Volume PC12200, Low-Dimensional Materials and Devices 2022; PC122000M (2022) https://doi.org/10.1117/12.2632906
Event: SPIE Nanoscience + Engineering, 2022, San Diego, California, United States

Conference Poster

Abstract

This conference presentation was prepared for the Low-Dimensional Materials and Devices 2022 conference at SPIE Optics + Photonics 2022.

Citation Download Citation

Suhan Lee, Yong-Jin Yoon, and Chee Seng Ng "In-situ electrical and electrochemical characteristic measurement using AFM in high temperature", Proc. SPIE PC12200, Low-Dimensional Materials and Devices 2022, PC122000M (3 October 2022); https://doi.org/10.1117/12.2632906

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available