PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Low noise dc electrical transport measurements provide a reliable means of characterizing the quality of the Josephson junctions (JJs) that form the heart of superconducting qubits. Measurements of the current-voltage (IV) characteristics can provide a direct readout of important junction parameters such as the Josephson energy Ej and the charging energy Ec. Here we report our investigation of an unexpected feature in the IV characteristics: the appearance of a finite resistance at currents below the critical current, where the resistance of the junction is expected to vanish. This “zero bias” resistance is observed in all the JJs that we have measured, fabricated by four different groups in the SQMS collaboration. The origin of this zero bias resistance and its potential implications for qubit performance will be discussed.
Venkat Chandrasekhar
"Qualifying transmon qubits using dc transport measurements", Proc. SPIE PC12912, Quantum Sensing, Imaging, and Precision Metrology II, PC129123A (13 March 2024); https://doi.org/10.1117/12.3011695
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Venkat Chandrasekhar, "Qualifying transmon qubits using dc transport measurements," Proc. SPIE PC12912, Quantum Sensing, Imaging, and Precision Metrology II, PC129123A (13 March 2024); https://doi.org/10.1117/12.3011695