Speckle Simulation for Metrology
Abstract
In most imaging applications, speckle is a nuisance, and various methods are used to attempt to suppress it. However, in the field of metrology, speckle can be a friend rather than a foe, and many methods for using speckle in measurement have been devised. Here we will simulate only a few of such methods.
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KEYWORDS
Diffusers

Speckle

Speckle pattern

Metrology

Sensors

Image filtering

Phase shifts

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