Farnood K. Rezaie,1 Christian W. Smith,2 Janardan Nath,2 Nima Nader,3 Monas Shahzad,4 Justin W. Cleary,3 Ivan Avrutsky,5 Robert E. Peale2
1Skorpios Technologies, Inc. (United States) 2Univ. of Central Florida (United States) 3Air Force Research Lab. (United States) 4Forman Christian College (Pakistan) 5Wayne State Univ. (United States)
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Optical constants for evaporated bismuth (Bi) films were measured by ellipsometry and compared with those published for single crystal and melt-cast polycrystalline Bi in the wavelength range of 1 to 40 μm. The bulk plasma frequency ωp and high-frequency limit to the permittivity ε∞ were determined from the long-wave portion of the permittivity spectrum, taking previously published values for the relaxation time τ and effective mass m . This part of the complex permittivity spectrum was confirmed by comparing calculated and measured reflectivity spectra in the far-infrared. Properties of surface polaritons (SPs) in the long-wave infrared were calculated to evaluate the potential of Bi for applications in infrared plasmonics. Measured excitation resonances for SPs on Bi lamellar gratings agree well with calculated resonance spectra based on grating geometry and complex permittivity.
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Farnood K. Rezaie, Christian W. Smith, Janardan Nath, Nima Nader, Monas Shahzad, Justin W. Cleary, Ivan Avrutsky, Robert E. Peale, "Infrared surface polaritons on bismuth," J. Nanophoton. 9(1) 093792 (17 February 2015) https://doi.org/10.1117/1.JNP.9.093792