Refractometry by minimum deviation: accuracy analysis

Diana Tentori-Santa-Cruz; Jesus R. Lerma

doi:10.1117/12.55573

1 February 1990 Refractometry by minimum deviation: accuracy analysis

Diana Tentori-Santa-Cruz, Jesus R. Lerma

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Optical Engineering, Vol. 29, Issue 2, (February 1990). https://doi.org/10.1117/12.55573

Abstract

We analyze the accuracy achieved when evaluating high refractive indices by minimum deviation deflectometry.

Citation Download Citation

Diana Tentori-Santa-Cruz and Jesus R. Lerma "Refractometry by minimum deviation: accuracy analysis," Optical Engineering 29(2), (1 February 1990). https://doi.org/10.1117/12.55573

Published: 1 February 1990

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