Open Access
15 October 2015 Accuracy improvement in laser stripe extraction for large-scale triangulation scanning measurement system
Yang Zhang, Wei Liu, Xiaodong Li, Fan Yang, Peng Gao, Zhenyuan Jia
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Abstract
Large-scale triangulation scanning measurement systems are widely used to measure the three-dimensional profile of large-scale components and parts. The accuracy and speed of the laser stripe center extraction are essential for guaranteeing the accuracy and efficiency of the measuring system. However, in the process of large-scale measurement, multiple factors can cause deviation of the laser stripe center, including the spatial light intensity distribution, material reflectivity characteristics, and spatial transmission characteristics. A center extraction method is proposed for improving the accuracy of the laser stripe center extraction based on image evaluation of Gaussian fitting structural similarity and analysis of the multiple source factors. First, according to the features of the gray distribution of the laser stripe, evaluation of the Gaussian fitting structural similarity is estimated to provide a threshold value for center compensation. Then using the relationships between the gray distribution of the laser stripe and the multiple source factors, a compensation method of center extraction is presented. Finally, measurement experiments for a large-scale aviation composite component are carried out. The experimental results for this specific implementation verify the feasibility of the proposed center extraction method and the improved accuracy for large-scale triangulation scanning measurements.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Yang Zhang, Wei Liu, Xiaodong Li, Fan Yang, Peng Gao, and Zhenyuan Jia "Accuracy improvement in laser stripe extraction for large-scale triangulation scanning measurement system," Optical Engineering 54(10), 105108 (15 October 2015). https://doi.org/10.1117/1.OE.54.10.105108
Published: 15 October 2015
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CITATIONS
Cited by 17 scholarly publications and 1 patent.
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KEYWORDS
Cameras

Reflectivity

Image analysis

Imaging systems

Optical engineering

Optical scanning systems

Transmitters

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