Open Access
8 September 2017 Special Section Guest Editorial: Interferometry
Author Affiliations +
Abstract
This guest editorial introduces the Special Section on Interferometry.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
Peter J. de Groot and Erik Novak "Special Section Guest Editorial: Interferometry," Optical Engineering 56(11), 111701 (8 September 2017). https://doi.org/10.1117/1.OE.56.11.111701
Published: 8 September 2017
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometry

Metrology

Optical engineering

Interferometers

Microscopy

Optics manufacturing

Distance measurement

Back to Top