24 August 2017 Modified correlation method to autofocus particles in digital in-line holography
Daniel H. Martínez-Suárez, Alejandro Restrepo-Martínez, Alejandro Mira-Agudelo, Francisco E. López-Giraldo
Author Affiliations +
Abstract
A method is proposed to automatically evaluate the focal planes of spherical particles. This method compares the correlation coefficients of multiple reconstructed planes relative to a reference plane. The particles are located where a minimum correlation is found, and reconstructions are made using an angular spectrum propagator. The Hough transform is employed to segment the hologram, thereby enabling the detection of circular shapes, such as Airy patterns, and the edges of the particles themselves. The autofocus is improved by creating a correlation matrix using an iterative process, which reduces the computational cost of the particle display processes in their respective focal planes. A theoretical model was studied to estimate the longitudinal and transverse magnifications of the focused particles caused by the influence of aberrations in the reconstruction of digital holograms due to the spherical reference wave used. Experimentally, laser light was used to illuminate 5-μm latex particles, which was recorded by a CCD camera with a 9.9-μm pixel size. The reconstructions measured an average particle radius of 71.3±16.3  μm in the average focal plane, which was estimated to be 60.65±0.22  mm from the hologram where the magnifications were considered.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2017/$25.00 © 2017 SPIE
Daniel H. Martínez-Suárez, Alejandro Restrepo-Martínez, Alejandro Mira-Agudelo, and Francisco E. López-Giraldo "Modified correlation method to autofocus particles in digital in-line holography," Optical Engineering 56(11), 111715 (24 August 2017). https://doi.org/10.1117/1.OE.56.11.111715
Received: 20 April 2017; Accepted: 24 July 2017; Published: 24 August 2017
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KEYWORDS
Particles

Holograms

Digital holography

Holography

Spherical lenses

Diffraction

Optical engineering

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