Interface evolution of cosputtering NiC/Ti multilayer for neutron application

Jingtao Zhu; Hangyu Zhu; Hu Wang; Jiayi Zhang; Jianda Shao; Sheng Guo; Kui Yi; Jiaoling Zhao

doi:10.1117/1.OE.60.7.075107

27 July 2021 Interface evolution of cosputtering NiC/Ti multilayer for neutron application

Jingtao Zhu, Hangyu Zhu, Hu Wang, Jiayi Zhang, Jianda Shao, Sheng Guo, Kui Yi, Jiaoling Zhao

Author Affiliations +

Funded by: National Natural Science Foundation of China (NSFC)

Optical Engineering, Vol. 60, Issue 7, 075107 (July 2021). https://doi.org/10.1117/1.OE.60.7.075107

Abstract

Tracking the interfacial evolution in Ni/Ti multilayers is a crucial aspect of fabricating neutron supermirrors. According to the Debye–Waller factor, the reflectivity of neutron supermirrors is modulated by the interface width, which includes interface roughness and diffusion characteristics. Significant effort has been devoted to shrinking the interface width using mixed working gases or targets during the sputtering process. To elucidate the interfacial evolution, NiC/Ti and Ni/Ti multilayers with different periods were fabricated using direct-current magnetron sputtering. The NiC layers were deposited by co-sputtering Ni and C targets. The interfacial structure and evolution within the multilayers were characterized by grazing incident x-ray reflectivity and transmission electron microscopy (TEM), respectively. The Ni layers in the Ni/Ti multilayers underwent a higher degree of crystallization, resulting in rough interfaces. Moreover, TEM images of the Ni/Ti multilayers suggest that the interface diffusion in the Ni-on-Ti layers reduces the interface smoothness. However, C doping suppresses the crystallization of the Ni layer to achieve smoother Ni/Ti interfaces, thereby improving the interface quality.

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Jingtao Zhu, Hangyu Zhu, Hu Wang, Jiayi Zhang, Jianda Shao, Sheng Guo, Kui Yi, and Jiaoling Zhao "Interface evolution of cosputtering NiC/Ti multilayer for neutron application," Optical Engineering 60(7), 075107 (27 July 2021). https://doi.org/10.1117/1.OE.60.7.075107

Received: 5 March 2021; Accepted: 15 July 2021; Published: 27 July 2021

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