Dr. Alem Gebru
Product Engineer at Lund Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 22 July 2019 Paper
Proceedings Volume 11075, 110750Q (2019) https://doi.org/10.1117/12.2527224
KEYWORDS: Backscatter, Modulation, LIDAR, Silicon, Polarimetry, Spectroscopy, Matrices, Surveillance, Scattering, Polarization

SPIE Journal Paper | 31 January 2017
JARS, Vol. 11, Issue 01, 016015, (January 2017) https://doi.org/10.1117/12.10.1117/1.JRS.11.016015
KEYWORDS: Short wave infrared radiation, Backscatter, Sensors, Near infrared, Reflectivity, Hyperspectral imaging, Calibration, Remote sensing, In situ remote sensing, Modulation

Proceedings Article | 19 September 2016 Presentation + Paper
Proceedings Volume 9975, 997504 (2016) https://doi.org/10.1117/12.2236010
KEYWORDS: Short wave infrared radiation, Near infrared, Remote sensing, Reflectivity, Backscatter, Sensors, Silicon, Indium gallium arsenide, Sensing systems, Modulation

SPIE Journal Paper | 18 December 2014
JARS, Vol. 8, Issue 01, 083503, (December 2014) https://doi.org/10.1117/12.10.1117/1.JRS.8.083503
KEYWORDS: Sensors, Near infrared, Atmospheric sensing, Silicon, Short wave infrared radiation, LIDAR, Spectroscopy, Signal detection, Scattering, Indium gallium arsenide

Proceedings Article | 8 October 2014 Paper
Proceedings Volume 9221, 922106 (2014) https://doi.org/10.1117/12.2060827
KEYWORDS: Sensors, Near infrared, Silicon, Spectroscopy, Short wave infrared radiation, LIDAR, Signal detection, Thin films, Atmospheric sensing, Visible radiation

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