Dr. Anand K. Asundi
Principal Consultant at d'Optron Pte Ltd
SPIE Involvement:
Author | Editor
Area of Expertise:
Optical Metrology , Photomechanics , Fiber Optic Sensors , Quantitative Phase Imaging , Computational 3D Imaging and Measurement , Optical Non-Destructive Testing
Websites:
Publications (265)

Proceedings Article | 15 February 2024 Paper
Ajeetkumar Patil, Anusha Pillai, Saritha Kamath U, Sushma Belurkar, Anand Asundi
Proceedings Volume 13069, 130690P (2024) https://doi.org/10.1117/12.3023411
KEYWORDS: Red blood cells, 3D image processing, Phase imaging, Polystyrene, Biological samples, Diseases and disorders, Biological imaging, Visualization, 3D metrology

Proceedings Article | 16 October 2019 Paper
Juntong Xi, Anand Asundi, Chunwei Zhang, Hong Zhao, Zhenyang Zhang, Jiacheng Qiao
Proceedings Volume 11205, 112050F (2019) https://doi.org/10.1117/12.2541665
KEYWORDS: Edge detection, Fringe analysis, Error analysis, 3D metrology, Mechanical engineering, Optics manufacturing, Optical testing, Interferometry

Proceedings Article | 10 September 2019 Presentation
Proceedings Volume 11102, 111020J (2019) https://doi.org/10.1117/12.2524704
KEYWORDS: Interferometers, Profiling, Biomedical optics, Nanotechnology, Holographic interferometry, Holograms, Interferometry, Spherical lenses, Cylindrical lenses, Corrosion

Proceedings Article | 24 July 2018 Paper
Chongtian Huang, Hongtao Zhong, Anand Asundi
Proceedings Volume 10827, 1082714 (2018) https://doi.org/10.1117/12.2503159
KEYWORDS: Sensors, Robotics, Image processing, 3D modeling, Image sensors, Optical engineering, Robots, Virtual reality, Speckle, Visualization

Proceedings Article | 24 July 2018 Paper
Proceedings Volume 10827, 1082720 (2018) https://doi.org/10.1117/12.2500463
KEYWORDS: Distortion, Calibration, Cameras, Sensors, Imaging systems, 3D image reconstruction, Metals, Image processing, 3D metrology, Error analysis

Showing 5 of 265 publications
Proceedings Volume Editor (33)

SPIE Conference Volume | 18 September 2020

SPIE Conference Volume | 4 October 2019

SPIE Conference Volume | 9 August 2018

Showing 5 of 33 publications
Conference Committee Involvement (68)
Applied Optical Metrology V
22 August 2023 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Applied Optical Metrology IV
4 August 2021 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Showing 5 of 68 Conference Committees
Course Instructor
NON-SPIE: Basic Optical Engineering
Introduction to Optical Engineering with basic principles of Optics and Photonics
NON-SPIE: Workshop in Aspheric Optics
Aspheric Optics design, manufacturing and testing.
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