Mr. Andreas Kunz Profile

Andreas Kunz

Business Director at FISBA AG

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 1 April 2022 Presentation

Precision molded laser-line generators

Martin Forrer, Eckhard Langenbach, Andreas Kunz, Aline Dotta, Hans Forrer, Rita Schlaginhaufen, Bernd Granzin

Proceedings Volume PC11982, PC1198207 (2022) https://doi.org/10.1117/12.2610733

KEYWORDS: Lenses, Testing and analysis, Light sources

Read Abstract +

Proceedings Article | 5 March 2021 Presentation + Paper

Collimation performance measurement of FAC lenses by active and automated alignment

M. Forrer, V. Lendenmann, B. Rusconi, P. Wüst, H. Forrer, A. Kunz, H. Moser

Proceedings Volume 11667, 1166705 (2021) https://doi.org/10.1117/12.2579175

KEYWORDS: Antireflective coatings, Absorption, Silica, Visualization, Collimation, Coating

Read Abstract +

Proceedings Article | 21 February 2020 Paper

High precision automated tab assembly with micro optics for optimized high-power diode laser collimation

M. Forrer, H. Strub, T. Honig, N. Koller, A. Kunz, H. Moser, C. Brecher, M. Hoeren, D. Zontar

Proceedings Volume 11261, 112610B (2020) https://doi.org/10.1117/12.2543738

KEYWORDS: Semiconductor lasers, Micro optics, Tolerancing, Assembly tolerances, Collimation, High power lasers, Control systems, Laser bonding, Active optics, Optical alignment, High power diode lasers

Read Abstract +

Proceedings Article | 26 February 2018 Presentation + Paper

Impact of absorption in fast axis collimation lenses

M. Huber, F. Saupe, P. Wuest, H. Forrer, A. Kunz, H. Moser

Proceedings Volume 10513, 105130P (2018) https://doi.org/10.1117/12.2291672

KEYWORDS: Absorption, Coating, Semiconductor lasers, Finite element methods, Glasses, Thermal effects, Collimation, Lenses, Data modeling, Optical simulations

Read Abstract +

Proceedings Article | 15 October 2013 Paper

Interaction of N-FK5 and L-BAL35 optical glass with various carbide and other precision glass mold tooling

E. Koontz, P. Wachtel, J. David Musgraves, K. Richardson, S. Mourad, M. Huber, A. Kunz, M. Forrer

Proceedings Volume 8884, 88841Y (2013) https://doi.org/10.1117/12.2035217

KEYWORDS: Glasses, Silicon carbide, Glass molding, Scanning electron microscopy, Contamination, Potassium, Reflectivity, Precision glass molding, Tungsten, Chemical vapor deposition

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years