With the development of terahertz technology and increasing studies on terahertz target scattering properties, research on terahertz target scattering properties measurements attracts more and more attention. In this paper, to solve problems in the detection process, we design a controlling software for Continuous-Wave (CW) terahertz target scattering properties measurements. The software is designed and programmed based on LabVIEW. The software controls the whole system, involving the switch between the target and the calibration target, the rotation of target, collection, display and storage of the initial data and display, storage of the data after the calibration process. The experimental results show that the software can accomplish the expected requirement, enhance the speed of scattering properties measurements and reduce operation errors.
We present a system to measure objective backscattering properties at 2.52 terahertz (THz). The optical setup combining 90° off-axis parabolic mirrors with 15° off-axis parabolic mirror decreases the size of the system and then realizes its compact structure. The calibration object, a conducting sphere with a diameter of 50 mm, was introduced to eliminate the influence of the instability of THz radiation and the background noise on measurement results. The lock-in amplifier was adopted to enhance the signal-to-noise ratio (SNR) and then make it possible to observe delicate backscattering behaviors on the surface of the object. Backscattering properties of four scale models were measured in this paper. Experimental results indicate that the maximal error of our system is less than 1 dB, paving the way for practical measurements of objective backscattering properties at THz frequencies.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.