The technical objective of the work reported here is to assess whether radio-frequency (RF) measurements made on coplanar
waveguide (CPW) test structures, which are replicated in conducting material on insulating substrates, could be
employed to extract the critical dimension (CD) of the signal line using its center-to-center separation from the groundlines
as a reference. The specific near-term objective is to assess whether this CPW-based CD-metrology has sensitivity
and repeatability competitive with the other metrology techniques that are now used for chrome-on-glass (COG)
photomasks. An affirmative answer is encouraging because advancing to a non-contact and non-vacuum
implementation would then seem possible for this application. Our modeling of specific cases shows that, when the
pitch of the replicated lines of the CPW is maintained constant, the sensitivity of its characteristic impedance to the CDs
of the signal and ground lines is approximately 60 Ω/μm. This is a potentially useful result. For the same
implementation, the quantity ∂C/∂w has a value of approximately 45 (pF/m)/μm, which appears to be large enough to
provide acceptable accuracy.
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