Prof. Chunlin Huo
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 November 2024 Poster + Paper
Proceedings Volume 13242, 132422C (2024) https://doi.org/10.1117/12.3037032
KEYWORDS: Phosphorescence, Carbon dots, Fluorescence, Design, Quantum particles, Particles, Environmental monitoring, Carbon, Cadmium sulfide, Quantum experiments

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 132410R (2024) https://doi.org/10.1117/12.3037029
KEYWORDS: Computed tomography, Manufacturing, Metrology, 3D metrology, X-ray computed tomography, Computing systems, X-rays, X-ray imaging, Measurement uncertainty, Calibration

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