Dr. Cristina Cadevall Profile

Dr. Cristina Cadevall

VP Software at Sensofar-Tech SL

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Author

Publications (17)

Proceedings Article | 20 June 2021 Presentation + Paper

Metrological characterization of different methods for recovering the optically sectioned image by means of structured light

P. Martínez, C. Bermudez, G. Carles, C. Cadevall, A. Matilla, J. Marine, R. Artigas

Proceedings Volume 11782, 117820Q (2021) https://doi.org/10.1117/12.2592371

KEYWORDS: Confocal microscopy, Microscopes, Metrology, Reconstruction algorithms, Image filtering, 3D metrology

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Proceedings Article | 1 April 2020 Presentation + Paper

Three-dimensional imaging confocal profiler without in-plane scanning

Pol Martínez, Carlos Bermudez, Cristina Cadevall, Aitor Matilla Ayala, Roger Artigas

Proceedings Volume 11352, 113520L (2020) https://doi.org/10.1117/12.2554716

KEYWORDS: Confocal microscopy, Microscopes, 3D metrology, 3D scanning, Interferometry, Microscopy

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Most 3D metrological microscopes used today require a scanning through the optical axis, which is time consuming. The common techniques are Coherence Scanning Interferometry (CSI), Imaging Confocal Microscopy (ICM), and Focus Variation (FV). If one technique is good for smooth surfaces, it is not for rough ones, while the good for rough is too noisy for smooth ones. Additionally, high local slopes are also dependent on the scattering properties of the surface, making the Numerical Aperture of the objective the most important property of the microscope. Imaging Confocal Microscopy is the best compromise in terms of surface application range (from smooth to rough), high local slopes on shiny surfaces, highest numerical aperture and highest possible magnification. Unfortunately, any kind of Confocal microscope today (laser scan, disc scan or microdisplay scan) requires an in-plane scanning to build up the confocal image in addition to the vertical scan, increasing the total measuring time in comparison to CSI and FV. This is against the needs of quality control in production environments, where scanning speed must be as short as possible. In this paper, we use a Microdisplay Scanning Microscope for obtaining the confocal image only relying on a single image per plane. We use a structured illumination to project a desired pattern onto the surface with a very well-defined frequency and direction. By means of the Hilbert transform, we digitally shift the projected pattern one or many times to recover the bright field and the optical sectioned images. This new method reduces significantly the measurement time, simplifies the overall cost of the system and eliminates the maintenance of scanning devices, while maintaining the optical sectioning properties of each plane. We also studied the performance of the resulting topography in terms of system noise, accuracy, repeatability and fidelity of the surface using different methods to obtain the confocal image. Finally, we also compared the results with true confocal results and with other techniques that require a single image per plane, such as Active illumination Focus Variation (AiFV).

Proceedings Article | 21 June 2019 Presentation + Paper

Active illumination focus variation

Carlos Bermudez, Pol Martinez, Cristina Cadevall, Roger Artigas

Proceedings Volume 11056, 110560W (2019) https://doi.org/10.1117/12.2525981

KEYWORDS: Confocal microscopy, Microscopes, Objectives, Calibration, 3D metrology, Cameras, Stars, Optical testing, 3D image processing, Standards development

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Proceedings Article | 24 May 2018 Presentation + Paper

Residual flatness error correction in three-dimensional imaging confocal microscopes

Carlos Bermudez, André Felgner, Pol Martinez, Aitor Matilla, Cristina Cadevall, Roger Artigas

Proceedings Volume 10678, 106780M (2018) https://doi.org/10.1117/12.2306903

KEYWORDS: Microscopes, Confocal microscopy, Calibration, 3D image processing, Monochromatic aberrations, Error analysis, Cameras

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Proceedings Article | 26 June 2017 Paper

Confocal unrolled areal measurements of cylindrical surfaces

A. Matilla, C. Bermudez, J. Mariné, D. Martínez, C. Cadevall, R. Artigas

Proceedings Volume 10329, 1032915 (2017) https://doi.org/10.1117/12.2269631

KEYWORDS: Confocal microscopy, 3D metrology, Optical inspection, Microscopes, Interferometry, Image resolution, Calibration, Image sensors, Sensors, Time metrology, Distortion, Microscopy

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Proceedings Article | 26 June 2017 Paper

Automated stent defect detection and classification with a high numerical aperture optical system

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10334, 103340C (2017) https://doi.org/10.1117/12.2275614

KEYWORDS: Line scan image sensors, Cameras, Binary data, Objectives, Optical inspection, Defect detection, Inspection, Image classification, Visualization, Microscopy, Image visualization, Process control

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Proceedings Article | 20 February 2017 Paper

Optical stent inspection of surface texture and coating thickness

Carlos Bermudez, Ferran Laguarta, Cristina Cadevall, Aitor Matilla, Sergi Ibañez, Roger Artigas

Proceedings Volume 10110, 1011007 (2017) https://doi.org/10.1117/12.2249614

KEYWORDS: Inspection, Coating, Optical inspection, 3D metrology, Reflectance spectroscopy, Microscopy, Metrology, 3D image processing, Cameras, Confocal microscopy, Interfaces, Microscopes, Interferometry, Objectives

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Proceedings Article | 26 April 2016 Paper

Three-dimensional measurements with a novel technique combination of confocal and focus variation with a simultaneous scan

A. Matilla, J. Mariné, J. Pérez, C. Cadevall, R. Artigas

Proceedings Volume 9890, 98900B (2016) https://doi.org/10.1117/12.2227054

KEYWORDS: 3D metrology, Imaging systems, 3D scanning, Confocal microscopy, 3D metrology, Manufacturing, Optics manufacturing, Microscopes, 3D modeling, Interferometry, Inspection, Optical testing, Astatine, Image fusion, Data fusion, Signal to noise ratio, Sensors, Cameras, Objectives, 3D image processing

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Proceedings Article | 22 September 2011 Paper

Non-contact measurement of aspherical and freeform optics with a new confocal tracking profiler

Agustí Pintó, Ferran Laguarta, Roger Artigas, Cristina Cadevall

Proceedings Volume 8169, 81690V (2011) https://doi.org/10.1117/12.896724

KEYWORDS: Confocal microscopy, Freeform optics, Aspheric lenses, Metrology, Calibration, Sensors, Spherical lenses, Optics manufacturing, 3D metrology, Error analysis

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Proceedings Article | 18 June 2007 Paper

Improving the measurement of thick and thin films with optical profiling techniques

Cristina Cadevall, Carles Oriach-Font, Roger Artigas, Agustí Pintó, Ferran Laguarta

Proceedings Volume 6616, 66161Z (2007) https://doi.org/10.1117/12.726187

KEYWORDS: Confocal microscopy, Semiconducting wafers, Thin films, Silicon, Objectives, Interfaces, Refractive index, Blue light emitting diodes, Light sources, Profiling

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Proceedings Article | 10 September 2004 Paper

Dual-technology optical sensor head for 3D surface shape measurements on the micro- and nanoscales

Roger Artigas, Ferran Laguarta, Cristina Cadevall

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545701

KEYWORDS: Confocal microscopy, Interferometers, Objectives, Head, 3D metrology, Profiling, Sensors, Microscopes, Inspection, Standards development

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Proceedings Article | 10 September 2004 Paper

3D shape measurement of nozzles on the micrometric scale

Ferran Laguarta, Roger Artigas, Cristina Cadevall

Proceedings Volume 5457, (2004) https://doi.org/10.1117/12.545673

KEYWORDS: 3D metrology, Charge-coupled devices, Confocal microscopy, Printing, Excimer lasers, Surface finishing, Objectives, Backscatter, Profiling, Polymers

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Proceedings Article | 30 May 2003 Paper

System for off-line optical paper inspection and quality control

Hugo Navarrete, Cristina Cadevall, Mouade Bouydain, Joan Anto, Josep Pladellorens, Josep Colom, Agusti Tosas

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500672

KEYWORDS: Image analysis, Statistical analysis, Image processing, Control systems, Inspection, Optical inspection, Confocal microscopy, Microscopes, Detection and tracking algorithms, Scanners

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Proceedings Article | 30 May 2003 Paper

Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials

Cristina Cadevall, Roger Artigas, Ferran Laguarta

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500470

KEYWORDS: Confocal microscopy, Silicon, Objectives, Interfaces, Refraction, Photoresist materials, Microscopes, Reflection, Wavefronts, Distance measurement

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Proceedings Article | 22 October 2002 Paper

Analysis and characterization of surface defects in ophthalmic lenses

Josep Pladellorens, Jesus Caum, Montserrat Tapias, Cristina Cadevall, Joan Anto, Xavier Fernandez

Proceedings Volume 4780, (2002) https://doi.org/10.1117/12.451806

KEYWORDS: Lenses, Image processing, Diffraction, Sensors, Image analysis, Image segmentation, Defect detection, Binary data, Control systems, Scattering

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Proceedings Article | 27 August 1999 Paper

Robust tool for simulation and modeling of complex optical systems: ROSA (real optical system analysis)

Josep Arasa, Carlos Pizarro, Cristina Cadevall, Nuria Tomas, J. Fernandez

Proceedings Volume 3737, (1999) https://doi.org/10.1117/12.359999

KEYWORDS: Systems modeling, Optical components, Geometrical optics, Ray tracing, Modeling, Lamps, Optical analysis, Optical design, Electromagnetism, Point spread functions

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Proceedings Article | 17 September 1997 Paper

Optical metrology of difficult-to-access surfaces: micromeasurement of the inner profiles of diamond wiring dies

Ferran Laguarta, I. Al-Khatib, Cristina Cadevall, Jesus Caum

Proceedings Volume 3098, (1997) https://doi.org/10.1117/12.281201

KEYWORDS: Diamond, Prototyping, Confocal microscopy, Charge-coupled devices, Objectives, Microscopes, Metrology, Computing systems, Image processing, Manufacturing

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Showing 5 of 17 publications

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