Dale Long
Chief Technology Officer at Advanced Thin Films
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 May 1996 Paper
Christopher Stolz, Francois Genin, Mark Kozlowski, Dale Long, Ramin Lalazari, Zhouling Wu, Pao-Kuang Kuo
Proceedings Volume 2714, (1996) https://doi.org/10.1117/12.240403
KEYWORDS: Laser damage threshold, Crystals, Multilayers, Optical coatings, Refractive index, Diffraction, Interfaces, Ion beams, Transmission electron microscopy, Polarizers

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