Dr. Daniel W. Thompson
at Univ of Nebraska/Lincoln
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 2 September 2008 Paper
Proceedings Volume 7069, 706904 (2008) https://doi.org/10.1117/12.794815
KEYWORDS: Space operations, Ellipsometry, Refraction, Lamps, Silicon, Satellites, Spectroscopic ellipsometry, Reflection, Crystals, Refractive index

Proceedings Article | 12 April 2005 Paper
Proceedings Volume 5713, (2005) https://doi.org/10.1117/12.593956
KEYWORDS: Silicon, Particles, Excimer lasers, Toxic industrial chemicals, Aluminum, Thin films, FT-IR spectroscopy, Semiconductor lasers, Silicon carbide, Nitrogen

Proceedings Article | 23 July 2003 Paper
Daniel Thompson, Galen Pfeiffer, Emil Berberov, Leon Castro, John Woollam
Proceedings Volume 4965, (2003) https://doi.org/10.1117/12.479262
KEYWORDS: Ellipsometry, Infrared radiation, Chemical analysis, Visible radiation, Reflection, Silicon, Spectroscopic ellipsometry, Optical testing, Absorption, Molecules

Proceedings Article | 30 May 2003 Paper
John Woollam, Corey Bungay, Li Yan, Daniel Thompson, James Hilfiker
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.474854
KEYWORDS: Ellipsometry, Infrared radiation, Anisotropy, Spectroscopic ellipsometry, Thin films, Vacuum ultraviolet, Refractive index, Data modeling, Calibration, Infrared spectroscopy

Proceedings Article | 1 October 1990 Paper
Proceedings Volume 1292, (1990) https://doi.org/10.1117/12.21026
KEYWORDS: Thallium, Pulsed laser deposition, Calcium, Barium, Composites, Copper, Superconductors, Annealing, Infrared radiation, Thin films

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