Dr. David F. R. Mildner Profile

Dr. David F. R. Mildner

at National Institute of Standards and Technology

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 30 December 2003 Paper

Convergent beam neutron crystallography

Walter Gibson, Arthur Schultz, James Richardson, John Carpenter, David Mildner, Heather Chen-Mayer, M. Miller, E. Maxey, Henry Prask, Thomas Gnaeupel-Herold, Russell Youngman

Proceedings Volume 5199, (2003) https://doi.org/10.1117/12.510736

KEYWORDS: Diffraction, Crystals, Sensors, Crystallography, Single crystal X-ray diffraction, Laser crystals, Proteins, Channel projecting optics, Integrated optics, Optical testing

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Proceedings Article | 18 November 2002 Paper

Monolithic polycapillary focusing optic for polychromatic neutron diffraction applications

David Mildner, Huaiyu Chen-Mayer, Walter Gibson, Arthur Schultz

Proceedings Volume 4785, (2002) https://doi.org/10.1117/12.452286

KEYWORDS: Diffraction, Crystals, Sensors, Channel projecting optics, Laser crystals, Capillaries, Glasses, Optical alignment, Crystal optics, Quartz

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Proceedings Article | 27 February 1997 Paper

Improvements in neutron beam applications by using capillary neutron optics

Robert Downing, Qi-Fan Xiao, V. Sharov, Igor Ponomarev, Johannes Ullrich, David Gibson, Huaiyu Chen-Mayer, David Mildner, G. Lamaze

Proceedings Volume 2867, (1997) https://doi.org/10.1117/12.267853

KEYWORDS: Charged particle optics, Capillaries, Optics manufacturing, Optical fibers, Profiling, Reflection, Collimation, Spatial resolution, Analytical research, Glasses

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Proceedings Article | 27 February 1997 Paper

Neutron depth profiling of elemental concentration using a focused beam

Huaiyu Chen-Mayer, G. Lamaze, David Mildner, Robert Downing

Proceedings Volume 2867, (1997) https://doi.org/10.1117/12.267885

KEYWORDS: Particles, Profiling, Optical fibers, Glasses, Silicon, Sensors, Boron, Nondestructive evaluation, Solids, Lenses

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Proceedings Article | 23 November 1992 Paper

Promise of silicon wafer microguides for future neutron optical elements

David Mildner, Huaiyu Chen-Mayer, Andreas Magerl, U. Gruening

Proceedings Volume 1738, (1992) https://doi.org/10.1117/12.130647

KEYWORDS: Semiconducting wafers, Silicon, Reflection, Nickel, Reflectivity, Optical components, Crystals, X-rays, Collimation, Interfaces

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Proceedings Article | 23 November 1992 Paper

Characterizing a neutron lens: study of capillary optics

Huaiyu Chen-Mayer, Robert Downing, David Mildner, V. Sharov

Proceedings Volume 1738, (1992) https://doi.org/10.1117/12.130649

KEYWORDS: Optical fibers, Reflectivity, Capillaries, Optical components, Computer simulations, Optical filters, Cameras, Absorption, Reflection, Lens design

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Showing 5 of 6 publications

Proceedings Volume Editor (1)

SPIE Conference Volume | 2 February 1993

Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications

Conference Committee Involvement (1)

Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications

20 July 1992 | San Diego, CA, United States

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