Mr. David Reolon Profile

David Reolon

at STIL SAS

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 11 August 2008 Paper

Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy

J. Cohen-Sabban, D. Reolon

Proceedings Volume 7064, 706405 (2008) https://doi.org/10.1117/12.797431

KEYWORDS: Interferometry, 3D metrology, Fresnel lenses, Microscopes, Microscopy, Inspection, Sensors, Spectroscopy, Optical interferometry, Visibility

Read Abstract +

Proceedings Article | 26 February 2004 Paper

High-resolution metrology of optical components by spectral interferometry

David Reolon, Gerald Brun, Karim Ben Houcine, Isabelle Verrier, Colette Veillas, Maxime Jacquot

Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.513400

KEYWORDS: Optical components, Interferometry, Refractive index, Mirrors, Michelson interferometers, Light sources, Spectroscopy, Glasses, Beam splitters, Metrology

Read Abstract +

Proceedings Article | 18 February 2004 Paper

Temporal analysis of optical complex structures: application to tomography through scattering media

Karim Ben Houcine, Gerald Brun, David Reolon, Maxime Jacquot, Isabelle Verrier, Colette Veillas

Proceedings Volume 5249, (2004) https://doi.org/10.1117/12.513618

KEYWORDS: Scattering, Modulation, Fresnel lenses, Optical correlators, Interferometers, Imaging systems, Sensors, Tomography, Scattering media, Spherical lenses

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years