Dr. Dinesh Nair
Manager at National Instruments Corp
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 10 September 2009 Paper
Proceedings Volume 7432, 74320A (2009) https://doi.org/10.1117/12.825194
KEYWORDS: Inspection, Wavelets, Feature extraction, Visualization, LabVIEW, Optical inspection, Image filtering, Image processing, Electronic filtering, Machine vision

Proceedings Article | 9 February 2006 Paper
Siming Lin, Rob Giesen, Dinesh Nair
Proceedings Volume 6070, 60700E (2006) https://doi.org/10.1117/12.653860
KEYWORDS: Image processing algorithms and systems, Image segmentation, Machine vision, Light sources and illumination, Digital filtering, Image filtering, Optical character recognition, Image processing, Inspection, Fuzzy logic

Proceedings Article | 13 November 2000 Paper
Proceedings Volume 4116, (2000) https://doi.org/10.1117/12.406523
KEYWORDS: Machine vision, RGB color model, Fuzzy logic, Image retrieval, Inspection, Light sources and illumination, Feature extraction, Databases, Quantization, Image processing

Proceedings Article | 13 November 2000 Paper
Dinesh Nair, Ram Rajagopal, Lothar Wenzel
Proceedings Volume 4116, (2000) https://doi.org/10.1117/12.406527
KEYWORDS: Fourier transforms, Image processing, Feature extraction, Matrices, Machine vision, Visual process modeling, Image understanding, Inspection, Signal processing

Proceedings Article | 2 November 1999 Paper
Dinesh Nair, Lothar Wenzel
Proceedings Volume 3807, (1999) https://doi.org/10.1117/12.367625
KEYWORDS: Image processing, Medical imaging, Monte Carlo methods, Statistical analysis, Reconstruction algorithms, Databases, Fractal analysis, Ray tracing, Algorithms, Machine vision

Conference Committee Involvement (8)
Image Processing: Machine Vision Applications VI
5 February 2013 | Burlingame, California, United States
Image Processing: Machine Vision Applications V
25 January 2012 | Burlingame, California, United States
Image Processing: Machine Vision Applications IV
25 January 2011 | San Francisco Airport, California, United States
Image Processing: Machine Vision Applications III
20 January 2010 | San Jose, California, United States
Image Processing: Machine Vision Applications II
22 January 2009 | San Jose, California, United States
Showing 5 of 8 Conference Committees
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