Dr. Dorus Elstgeest
at TNO
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume PC12953, PC129530I (2024) https://doi.org/10.1117/12.3010105
KEYWORDS: Hydrogen, Extreme ultraviolet, Vacuum, Photons, Pellicles, Extreme ultraviolet lithography, X-ray photoelectron spectroscopy, Thin films, Scanning electron microscopy, Chemical analysis

Proceedings Article | 4 November 2020 Presentation + Paper
Proceedings Volume 11517, 115170Z (2020) https://doi.org/10.1117/12.2573125
KEYWORDS: Reticles, Extreme ultraviolet lithography, Photomasks, Semiconducting wafers, Ruthenium, Scanners, Contamination, Integrated circuits, Semiconductors, X-rays

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top