Fabian Zimmer
at Fraunhofer-Institut für Photonische Mikrosysteme
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 19 May 2009 Paper
Proceedings Volume 7362, 73620J (2009) https://doi.org/10.1117/12.821715
KEYWORDS: Aluminum nitride, Silicon, Semiconducting wafers, Thin films, Sputter deposition, Finite element methods, X-ray diffraction, Microopto electromechanical systems, Crystals, Diffraction

Proceedings Article | 19 February 2009 Paper
Fabian Zimmer, Frank Niklaus, Martin Lapisa, Thomas Ludewig, Martin Bring, Martin Friedrichs, Thor Bakke, Harald Schenk, Wouter van der Wijngaart
Proceedings Volume 7208, 720807 (2009) https://doi.org/10.1117/12.808694
KEYWORDS: Silicon, Semiconducting wafers, Mirrors, Micromirrors, Wafer bonding, Adhesives, Oxides, Etching, Electrodes, Metals

SPIE Journal Paper | 1 April 2008
JM3, Vol. 7, Issue 02, 021005, (April 2008) https://doi.org/10.1117/12.10.1117/1.2911035
KEYWORDS: Spectroscopy, Silicon, Etching, Near infrared, Diffraction gratings, Diodes, Semiconducting wafers, Signal processing, Mirrors, Monochromators

Proceedings Article | 8 February 2008 Paper
Proceedings Volume 6887, 68870E (2008) https://doi.org/10.1117/12.762904
KEYWORDS: Hyperspectral imaging, Near infrared, Imaging systems, Spectroscopy, Mirrors, Diffraction gratings, Microopto electromechanical systems, Detector arrays, Collimators, Imaging spectroscopy

Proceedings Article | 2 October 2007 Paper
Proceedings Volume 6765, 67650I (2007) https://doi.org/10.1117/12.734016
KEYWORDS: Hyperspectral imaging, Near infrared, Spectroscopy, Detector arrays, Mirrors, Imaging systems, Diffraction gratings, Microopto electromechanical systems, Imaging spectroscopy, Collimators

Showing 5 of 12 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top