Felix Ströer
at Technische Univ Kaiserslautern
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 June 2019 Presentation + Paper
Proceedings Volume 11056, 110560Y (2019) https://doi.org/10.1117/12.2526005
KEYWORDS: Calibration, Standards development, Metrology, Spatial resolution, Manufacturing, Lithography, Sensor technology

Proceedings Article | 7 September 2018 Paper
T. Seyler, M. Fratz, T. Beckmann, A. Bertz, D. Carl, V. Grün, R. Börret, F. Ströer, J. Seewig
Proceedings Volume 10834, 108342B (2018) https://doi.org/10.1117/12.2319750
KEYWORDS: Sensors, Deconvolution, Digital holography, Confocal microscopy, Interferometers, Holograms, Surface roughness

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