Mr. George R. Sloan Profile

George R. Sloan

at Sandia National Labs

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 8 May 2006 Paper

A portfolio of fine resolution Ku-band miniSAR images: Part I.

A. Sweet, D. Dubbert, A. Doerry, G. Sloan, V. Dee Gutierrez

Proceedings Volume 6210, 621002 (2006) https://doi.org/10.1117/12.667613

KEYWORDS: Image resolution, Synthetic aperture radar, Ku band, Radar, Unmanned aerial vehicles, Fourier transforms, Ka band, Radar sensor technology, Roads, Robotics

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Proceedings Article | 8 May 2006 Paper

A portfolio of fine resolution Ku-band miniSAR images: Part II.

A. Sweet, D. Dubbert, A. Doerry, G. Sloan, V. Dee Gutierrez

Proceedings Volume 6210, 621006 (2006) https://doi.org/10.1117/12.667615

KEYWORDS: Image resolution, Synthetic aperture radar, Ku band, Radar, Unmanned aerial vehicles, Fourier transforms, Bridges, Ka band, Radar sensor technology, Diamond

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Proceedings Article | 5 May 2006 Paper

Results of the sub-thirty-pound high-resolution miniSAR demonstration

Dale Dubbert, April Sweet, George Sloan, Armin Doerry

Proceedings Volume 6209, 62090C (2006) https://doi.org/10.1117/12.666727

KEYWORDS: Image processing, Radar, Synthetic aperture radar, Antennas, Unmanned aerial vehicles, Sensors, Image acquisition, Image resolution, Receivers, Interfaces

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Proceedings Article | 30 August 2004 Paper

Affordable miniaturized SAR for tactical UAV applications

George Sloan, Dale Dubbert

Proceedings Volume 5409, (2004) https://doi.org/10.1117/12.541564

KEYWORDS: Synthetic aperture radar, Antennas, Unmanned aerial vehicles, Image quality, Image processing, Image acquisition, Radar, Image resolution, Transmitters, Field programmable gate arrays

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Proceedings Article | 16 January 2003 Paper

MEMS high-Q tunable capacitor for reconfigurable microwave integrated circuits

Christopher Nordquist, Arnoldo Muyshondt, Michael Pack, Patrick Finnegan, Christopher Dyck, Isak Reines, Garth Kraus, George Sloan, Charles Sullivan

Proceedings Volume 4981, (2003) https://doi.org/10.1117/12.480768

KEYWORDS: Capacitors, Capacitance, Metals, Data modeling, Microwave radiation, Dielectrics, Integrated circuits, Gold, Microelectromechanical systems, Reliability

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