Dr. HaiXia Shang
at Univ de Rennes 1
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 October 2003 Paper
Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500902
KEYWORDS: Atomic force microscopy, Scanning electron microscopy, Moire patterns, Microelectromechanical systems, Mica, Crystals, Mechanics, Spatial resolution, Scanners, Electronic components

Proceedings Article | 29 April 2003 Paper
Fulong Dai, HaiXia Shang, Chao Li, Huimin Xie
Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509787

Proceedings Article | 29 April 2003 Paper
HaiXia Shang, Huimin Xie, Fulong Dai
Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509793

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