Ms. Idoia Freijo-Martin Profile

Idoia Freijo-Martin

at European XFEL GmbH

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Author

Publications (11)

Proceedings Article | 3 October 2023 Presentation + Paper

Metrology and characterization of two optical delay line mirrors before and after B4C coating at European XFEL

Idoia Freijo Martin, Silja Schmidtchen, Maurizio Vannoni, Michael Störmer

Proceedings Volume 12695, 1269507 (2023) https://doi.org/10.1117/12.2675732

KEYWORDS: Coating, Mirrors, Parabolic mirrors, Mirror surfaces, X-rays, Surface finishing, Reflection, Metrology, Silicon, Polishing

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Proceedings Article | 3 October 2023 Presentation + Paper

Vibration studies at European XFEL hard x-ray beamlines

Silja Schmidtchen, Idoia Freijo Martin, Antje Trapp, Maurizio Vannoni, Harald Sinn

Proceedings Volume 12694, 126940E (2023) https://doi.org/10.1117/12.2677287

KEYWORDS: Mirrors, Vibration, Vacuum chambers, X-rays, Imaging systems, Equipment, Laser Doppler velocimetry, Optical components, Doppler effect

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Proceedings Article | 9 September 2019 Paper

Metrology of MID offset mirrors before and after coating

M. Vannoni, A. Zozulya, I. Frejio Martin, S. Schmidtchen, A. Madsen, M. Störmer

Proceedings Volume 11109, 111090B (2019) https://doi.org/10.1117/12.2530504

KEYWORDS: Mirrors, Coating, Finite element methods, Polishing, Metrology, X-rays, Grazing incidence

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Proceedings Article | 9 September 2019 Paper

Stress-releasing procedure approach for an X-ray mirror holder for round-robin measurements

S. Schmidtchen, M. Vannoni, I. Freijo-Martin, D. La Civita, H. Sinn

Proceedings Volume 11109, 1110904 (2019) https://doi.org/10.1117/12.2530635

KEYWORDS: Mirrors, X-rays, Metrology, Kinematics, X-ray diffraction, Fizeau interferometers, Polishing

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Proceedings Article | 18 September 2018 Paper

Metrology of micron focusing KB mirrors for SPB/SFX instrument and preliminary commissioning results at European XFEL

I. Freijo Martín, R. Bean, M. Vannoni, H. Sinn

Proceedings Volume 10761, 1076102 (2018) https://doi.org/10.1117/12.2322979

KEYWORDS: Mirrors, Metrology, X-rays, Fizeau interferometers, Grazing incidence

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The European XFEL generates extremely short and intense X-ray laser pulses, with high coherence and diffraction limited divergence. Due to these outstanding characteristics of the beam, ultra-flat X-ray mirrors of ultimate precision are needed to enable a wave front preserving transport of photons from the source to the experimental hall. One of the experimental stations already in operation is the SPB/SFX (Single Particles, Clusters and Biomolecules / Serial Femtosecond Crystallography) station. This instrument is dedicated to coherent diffraction imaging of single particles and structure determination with serial femtosecond crystallography. The instrument is also designed to investigate the structure of these systems as a function of time, using the short X-ray pulses. The optics used in the photon transport tunnels as well as in the experimental station need to fulfill really challenging specifications; therefore, they need to be inspected with metrology devices and methods of comparable precision. This paper presents the metrological characterization of the micron focusing mirrors for the SPB/SFX scientific instrument done with a large aperture Fizeau interferometer. The micron focusing system consists of 2 pairs of mirrors; each pair contains one flat and one elliptical mirror. One pair is vertically reflecting and the other pair is horizontally reflecting. The central profile specification for the mirrors is less than 2 nm peak-to-valley (P-V) figure error over the main surface shape. The measurements performed in our lab are all done in grazing incidence setup and with the mirrors facing side. Analyzing these data we can account many important parameters, as the peak-to-valley of the central profile, the radius, the gravity compensation profile and the ellipse parameters. The micron focusing mirrors have been recently installed in the corresponding chamber of the SPB/SFX Optics Hutch and they will be used very soon for the next User Experiments Run.

Proceedings Article | 7 September 2017 Presentation + Paper

Characterization of a 150-mm long variable line spacing plane grating through interferometry

M. Vannoni, I. Freijo-Martin

Proceedings Volume 10385, 1038507 (2017) https://doi.org/10.1117/12.2274214

KEYWORDS: Interferometry, X-rays, Photons, Femtosecond phenomena, Steiner quadruple pulse system, Spectroscopy, Laser scattering, Scattering, Mirrors, Photovoltaics

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Proceedings Article | 26 June 2017 Paper

Metrology and quality assurance for European XFEL long flat mirrors installation

Idoia Freijo Martín, Maurizio Vannoni, Harald Sinn

Proceedings Volume 10330, 1033007 (2017) https://doi.org/10.1117/12.2270312

KEYWORDS: Mirrors, Metrology, Polishing, X-rays, Femtosecond phenomena, Photons, Surface finishing, Cooling systems, Coating, Grazing incidence

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Proceedings Article | 14 June 2017 Presentation + Paper

Ultrahigh performance mirrors for diffraction limited light sources

M. Vannoni, I. Freijo-Martin

Proceedings Volume 10237, 102370O (2017) https://doi.org/10.1117/12.2268390

KEYWORDS: Mirrors, Diffraction, Free electron lasers, X-ray sources, X-ray optics, Interferometry, Polishing, Surface finishing, Metrology, Adaptive optics

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Proceedings Article | 8 September 2016 Presentation + Paper

Characterization of a mechanical bender for x-ray mirrors at European XFEL

Idoia Freijo Martín, Maurizio Vannoni, Valerija Music, Harald Sinn

Proceedings Volume 9965, 996504 (2016) https://doi.org/10.1117/12.2238064

KEYWORDS: Mirrors, X-rays, X-ray characterization, Control systems, Fizeau interferometers, Sensors, Mirrors, Fizeau interferometers, Sensors, X-ray characterization, Actuators, Calibration, Temperature metrology, Silicon

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Proceedings Article | 8 September 2016 Presentation + Paper

Surface measurements in "grazing incidence" interferometry for long x-ray mirrors: theoretical limits and practical implementations

Maurizio Vannoni, Idoia Freijo Martìn

Proceedings Volume 9962, 996207 (2016) https://doi.org/10.1117/12.2238623

KEYWORDS: Mirrors, Interferometry, X-rays, Grazing incidence, Calibration, Interferometry, X-rays, Metrology, X-ray optics, Inspection, Wavefronts, Optical components

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Proceedings Article | 21 June 2015 Paper

Metrological characterization of a large aperture Fizeau for x-ray mirrors measurement

Maurizio Vannoni, Idoia Freijo Martín

Proceedings Volume 9526, 95260A (2015) https://doi.org/10.1117/12.2184748

KEYWORDS: Mirrors, X-rays, Metrology, Grazing incidence, Wavefronts, Linear filtering, Optical filters, Electronic filtering, Fizeau interferometers, Interferometry

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Showing 5 of 11 publications

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