Jing Zheng
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 May 2024 Poster + Paper
Proceedings Volume 13083, 1308315 (2024) https://doi.org/10.1117/12.3018671
KEYWORDS: Sensors, Calibration, Sensor calibration, Control systems, Microelectromechanical systems, Metrology, Autocollimators, Accelerometers, Resistance, Optical gratings

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