Mr. Jonathan L. Kirschman Profile

Jonathan L. Kirschman

Research Associate at Lawrence Berkeley National Lab

SPIE Involvement:

Author

Publications (5)

SPIE Journal Paper | 1 August 2009

Optimal tuning and calibration of bendable mirrors with slope-measuring profilers

Wayne McKinney, Jonathan Kirschman, Alastair MacDowell, Anthony Warwick, Valeriy Yashchuk

OE, Vol. 48, Issue 08, 083601, (August 2009) https://doi.org/10.1117/12.10.1117/1.3204235

KEYWORDS: Mirrors, Calibration, Ray tracing, Optical engineering, Computer programming, Metrology, Error analysis, Geometrical optics, Synchrotrons, Light sources

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Proceedings Article | 3 September 2008 Paper

Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory

Jonathan Kirschman, Edward Domning, Wayne McKinney, Gregory Morrison, Brian Smith, Valeriy Yashchuk

Proceedings Volume 7077, 70770A (2008) https://doi.org/10.1117/12.796335

KEYWORDS: Sensors, Cameras, Calibration, Error analysis, Mirrors, Metrology, Optical components, X-ray optics, CCD image sensors, Channel projecting optics

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Proceedings Article | 20 September 2007 Paper

Flat-field calibration of CCD detector for long trace profiler

Jonathan Kirschman, Edward Domning, Keith Franck, Steven Irick, Alastair MacDowell, Wayne McKinney, Gregory Morrison, Brian Smith, Tony Warwick, Valeriy Yashchuk

Proceedings Volume 6704, 67040J (2007) https://doi.org/10.1117/12.732618

KEYWORDS: Sensors, Calibration, Cameras, CCD image sensors, CCD cameras, Charge-coupled devices, Photodiodes, X-ray optics, Personal digital assistants, Image resolution

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Proceedings Article | 20 September 2007 Paper

Precision tiltmeter as a reference for slope measuring instruments

Jonathan Kirschman, Edward Domning, Gregory Morrison, Brian Smith, Valeriy Yashchuk

Proceedings Volume 6704, 670409 (2007) https://doi.org/10.1117/12.732610

KEYWORDS: Sensors, Optical benches, Temperature metrology, X-ray optics, Channel projecting optics, Mirrors, Temperature sensors, Metrology, Calibration, Ceramics

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Proceedings Article | 20 September 2007 Paper

New procedures for the adjustment of elliptically bent mirrors with the long trace profiler

Wayne McKinney, Steven Irick, Jonathan Kirschman, Alastair MacDowell, Tony Warwick, Valeriy Yashchuk

Proceedings Volume 6704, 67040G (2007) https://doi.org/10.1117/12.736860

KEYWORDS: Mirrors, Ray tracing, Wavefronts, Geometrical optics, Computer programming, Metrology, Monochromatic aberrations, Error analysis, Synchrotron radiation, X-rays

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