Karell Bien-Aimé
at Commissariat à l'Énergie Atomique
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 December 2009 Paper
K. Bien-Aimé, A. Pereira, C. Belin, L. Gallais, P. Grua, I. Tovena-Pecault, J. Néauport, E. Fargin
Proceedings Volume 7504, 75040V (2009) https://doi.org/10.1117/12.836384
KEYWORDS: Contamination, Laser induced damage, Silica, Molecules, Liquids, Molecular lasers, Optical components, Optics manufacturing, Polishing, Laser damage threshold

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