Dr. Kristof Paredis
at imec
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume PC12053, PC120530L (2022) https://doi.org/10.1117/12.2614029
KEYWORDS: Atomic force microscopy, Neural networks, Metrology, Image processing, Convolution, Line scan image sensors, Scanning probe microscopy, Semiconductors

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11611, 116110J (2021) https://doi.org/10.1117/12.2583065
KEYWORDS: 3D metrology, Microscopy, Metrology, Switching, Tomography, Semiconductor manufacturing, Gallium arsenide, Diamond, 3D equipment, Transmission electron microscopy

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