Prof. Laurent Gallais-During Profile

Prof. Laurent Gallais-During

Professor at Institut Fresnel

SPIE Involvement:

Author

Publications (94)

Proceedings Article | 18 December 2024 Presentation

Quantitative study of mitigated damaged sites by adjustment of the focal spot for 10.6-µm CO2 lasers

Luis Alonso Vazquez-Zuniga, Jean-François Gleyze, Lucille Beziat, Philippe Cormont, Laurent Gallais

Proceedings Volume PC13190, PC131900N (2024) https://doi.org/10.1117/12.3032738

KEYWORDS: Carbon dioxide lasers, Laser processing, Silica, Ultraviolet radiation, National Ignition Facility, Laser induced damage, UV optics, Laser welding, Solids, Seaborgium

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Proceedings Article | 18 December 2024 Poster + Paper

Analysis of laser-induced contamination in the sub-picosecond UV regime and its consequences on laser beam quality in the context of industrial applications

Jules Herbuvaux, Frank Wagner, Luis Vazquez-Zuniga, Serge Monneret, Clemens Hoenninger, Julien Nillon, Laurent Gallais

Proceedings Volume 13190, 131900R (2024) https://doi.org/10.1117/12.3032734

KEYWORDS: Contamination, Ultraviolet radiation, Laser applications, Industrial applications, Laser beam propagation, Atmospheric propagation, Industry, Analytical research, Vacuum chambers, Optical surfaces

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Proceedings Article | 18 December 2024 Presentation + Paper

Measurement and simulation of wavefront deformation and spectral shift induced by high power CW laser in thin film optical filters

Mathias Soulier, Hélène Krol, Alexandra Rapaport, Serge Monneret, Julien Lumeau, Laurent Gallais

Proceedings Volume 13190, 1319005 (2024) https://doi.org/10.1117/12.3032891

KEYWORDS: Wavefronts, High power lasers, Thin films, Thermal deformation, Optical filters, Reflection, Deformation, Thermography, Refractive index

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Proceedings Article | 24 June 2024 Presentation + Paper

Absorption measurement and simulation of photo induced effects in thin-film optical filters

Mathias Soulier, Laurent Gallais, Julien Lumeau, Serge Monneret, Hélène Krol

Proceedings Volume 13020, 130200B (2024) https://doi.org/10.1117/12.3017404

KEYWORDS: Absorption, Light absorption, Thin films, Optical filters, Tunable filters, Thermography, High power lasers, Thermal modeling, Temperature metrology, Thin film coatings

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Proceedings Article | 24 June 2024 Presentation + Paper

Accurate measurement and reduction of losses in ion beam sputtering coatings

Alex Ribeaud, Jürgen Pistner, Isabel Vela-Perez, Julien Lumeau, Laurent Gallais, Rico Benz, Christoph Sturzenegger, Bernd Eiermann, Christian Mühlig

Proceedings Volume 13020, 130200P (2024) https://doi.org/10.1117/12.3023035

KEYWORDS: Absorption, Mirrors, Ions, Sputter deposition, Silica, Optical coatings, Laser scattering, Ion beams

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Proceedings Article | 6 June 2024 Poster

Towards the preparation of nuclear fuel ceramic samples with ultrafast laser micromachining

C. Cifuentes Quintal, T. Doualle, Y. Pontillon, L. Gallais

Proceedings Volume 13005, 130050R (2024) https://doi.org/10.1117/12.3016944

KEYWORDS: Ceramics, Micromachining, Ultrafast lasers, Temperature control, Thermal imaging cameras, Thermal effects, Temperature metrology, Safety, Oxides, Numerical simulations

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Proceedings Article | 24 November 2023 Paper

Measurement of optical coatings absorption at 1570 nm and simulations of photo-induced modifications of spectral function under high power laser exposure

Mathias Soulier, Laurent Gallais, Julien Lumeau, Hélène Krol, Emilie Steck, Mathieu Boutillier

Proceedings Volume 12726, 127260L (2023) https://doi.org/10.1117/12.2685174

KEYWORDS: Absorption, Optical filters, Optical coatings, Calibration, Thin films, Thermography, Thermal modeling, Temperature metrology

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Proceedings Article | 24 November 2023 Presentation + Paper

Influence of the multilayer dielectric design on the laser damage resistance of pulse-compression gratings

Saaxewer Diop, Nicolas Bonod, Marine Chorel, Éric Lavastre, Nadja Roquin, Lilian Heymans, Pierre Brianceau, Laurent Gallais, Laurent Lamaignère

Proceedings Volume 12726, 1272607 (2023) https://doi.org/10.1117/12.2685304

KEYWORDS: Design and modelling, Laser induced damage, Resistance, Dielectrics, Optical gratings, Electric fields, Diffraction gratings, Laser damage threshold, Etching, Diffraction

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Proceedings Article | 24 November 2023 Presentation + Paper

Study of high-performance IBS coatings for near-IR laser applications

Alex Ribeaud, Jürgen Pistner, Mathias Soulier, Julien Lumeau, Laurent Gallais, Rico Benz, Christoph Sturzenegger, Bernd Eiermann, Christian Mühlig, Thomas Gischkat, Sven Schröder

Proceedings Volume 12726, 1272605 (2023) https://doi.org/10.1117/12.2685243

KEYWORDS: Optical coatings, Laser scattering, Laser applications, Light absorption, Thin film coatings, Sputter deposition, Ion beams, Absorption, Visible radiation, Thin films

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Proceedings Article | 2 December 2022 Poster + Presentation + Paper

Sub-ps MHz green laser-induced contamination on dielectric coatings in air

Marek Stehlík, Janis Zideluns, Frank Wagner, Fabien Lemarchand, Camille Petite, Antonin Moreau, Aude Lereu, Marco Minissale, Julien Lumeau, Laurent Gallais

Proceedings Volume 12300, 123000A (2022) https://doi.org/10.1117/12.2642516

KEYWORDS: Contamination, Niobium, Dielectrics, Optical coatings, Thin films, Optical components, Laser applications, Deposition processes, Optical testing, Silica, Hafnium

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Proceedings Article | 2 December 2022 Presentation + Paper

Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings

Marek Stehlík, Goby Govindassamy, Janis Zideluns, Fabien Lemarchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

Proceedings Volume 12300, 123000G (2022) https://doi.org/10.1117/12.2641792

KEYWORDS: Lutetium, Sapphire, Aluminum, Refractive index, Laser induced damage, Niobium, Laser damage threshold, Oxides, Scandium, Yttrium

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Proceedings Article | 2 December 2022 Presentation + Paper

Low absorption metrology of thin film optical components for high power continuous wave lasers

Camille Petite, Jeanne Graisset, Antonin Moreau, Hélène Krol, Catherine Grèzes-Besset, Julien Lumeau, Laurent Gallais

Proceedings Volume 12300, 123000I (2022) https://doi.org/10.1117/12.2642761

KEYWORDS: Absorption, Mirrors, Calibration, Thermography, Modulation, Continuous wave operation, Cameras, Optical components, High power lasers

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Proceedings Article | 30 May 2022 Presentation

Super-resolved imaging under total internal reflexion using random illumination microscopy (RIM)

Kevin Affannoukoué, Guillaume Maire, Thomas Mangeat, Simon Labouesse, Claire Estibal, Benoît Rogez, Guillaume Giroussens, Loic Legoff, Julien Savatier, Laurent Gallais, Marc Allain, Jérome Idier, Anne Sentenac

Proceedings Volume PC12144, PC121440J (2022) https://doi.org/10.1117/12.2624255

KEYWORDS: Reflection, Microscopy, Luminescence, Image resolution, Microscopes, Calibration, Super resolution, Speckle pattern, Signal to noise ratio, Scattering

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SPIE Journal Paper | 18 May 2022 Open Access

Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (Erratum)

Marek Stehlik, Goby Govindassamy, Janis Zideluns, Fabien Le Marchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

OE, Vol. 61, Issue 07, 079801, (May 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.079801

KEYWORDS: Thin films, Thin film deposition, Laser induced damage, Laser damage threshold, Optical engineering, Optoelectronics

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SPIE Journal Paper | 23 April 2022 Open Access

Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films

Marek Stehlik, Goby Govindassamy, Janis Zideluns, Fabien Lemarchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

OE, Vol. 61, Issue 07, 071603, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.071603

KEYWORDS: Lutetium, Laser induced damage, Hybrid fiber optics, Aluminum, Laser damage threshold, Sapphire, Refractive index, YAG lasers, Thin films, Niobium

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Proceedings Article | 12 October 2021 Poster + Presentation

Multipass Lock-In Thermography for optical coating absorption measurements

Camille Petite, Remi Marcouille, Antonin Moreau, Hélène Krol, Catherine Grezes-Besset, Julien Lumeau, Laurent Gallais

Proceedings Volume 11910, 119101G (2021) https://doi.org/10.1117/12.2603979

KEYWORDS: Absorption, Optical coatings, Thermography, Optical testing, Thin film coatings, Laser development, Ytterbium, Thin films, Thin film deposition, Thermal effects

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Proceedings Article | 12 October 2021 Presentation

Investigation on beam-size effect on sub-picosecond LIDT of dielectric oxide coatings

Marek Stehlik, Frank Wagner, Janis Zideluns, Fabien Lemarchand, Julien Lumeau, Laurent Gallais

Proceedings Volume 11910, 119100U (2021) https://doi.org/10.1117/12.2598855

KEYWORDS: Dielectrics, Laser induced damage, Optical coatings, Laser damage threshold, Oxides, Optical components, Pulsed laser operation, Contamination, Absorption, Testing and analysis

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Proceedings Article | 12 October 2021 Poster + Presentation

Laser-induced contamination on dielectric coatings in sub-ps MHz regime at 515 nm

Marek Stehlik, Frank Wagner, Janis Zideluns, Fabien Lemarchand, Julien Lumeau, Laurent Gallais

Proceedings Volume 11910, 119101Q (2021) https://doi.org/10.1117/12.2598856

KEYWORDS: Dielectrics, Contamination, Laser marking, Laser drilling, Ionization, Semiconductor lasers, Reliability, Oxides, Optical filters, Optical design

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Proceedings Article | 12 September 2021 Presentation

Metrology of thin film optical components for high power continuous wave lasers

Camille Petite, Antonin Moreau, Hélène Krol, Catherine Grèzes-Besset, Julien Lumeau, Laurent Gallais

Proceedings Volume 11872, 118720Y (2021) https://doi.org/10.1117/12.2597144

KEYWORDS: Absorption, Thin films, Thermography, Optical components, Continuous wave operation, Metrology, Laser metrology, High power lasers, Titanium dioxide, Temperature metrology

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Proceedings Article | 12 September 2021 Presentation

Minimization of electric field intensity in pillars of MLD gratings through the design of the planar dielectric multilayers

Saaxewer Diop, Nicolas Bonod, Laurent Gallais, Marine Chorel, Eric A. Lavastre, Laurent Lamaignère

Proceedings Volume 11872, 1187207 (2021) https://doi.org/10.1117/12.2598972

KEYWORDS: Dielectrics, Optical design, Laser induced damage, Diffraction, Laser damage threshold, Etching, Picosecond phenomena, Optical components, Mirrors, Laser therapeutics

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Multilayer dielectric gratings (MLDG) are key optical components of Petawatt-class laser that are used to compress short pulses of high intensities. Laser-induced damage can occur on the top area of the components, typically arising in the pillars periodically etched. This phenomenon limits the power yielded by high power laser facilities such as PETAL (PETwatt Aquitaine Laser) laser facility. PETAL is expected to delivery pulses with a wavelength around 1053 nm, an energy around 3 kJ and a pulse duration between 0.5 and 10 ps. Coupled with LMJ (Laser MegaJoule), PETAL aims to study materials in extreme conditions to reproduce the environment in the heart of stars or planets, fusion by inertial confinement, particularly rapid ignition and shock ignition, and nuclear physics for medical proton therapy. In this study, we present a process to improve the laser-induced damage threshold of PETAL pulse-compression gratings in sub-picosecond regime by reducing the electric field intensity in the pillars. PETAL gratings have specific parameters of operation: Transverse Electric polarization, under vacuum, a period equal to 1780 lines per mm and diffraction efficiency higher than 95% for the -1st order. Theoretical designs are calculated with a code developed at the Fresnel Institute. The code solves Fresnel equations by using the differential method, Fast Fourier Factorization (FFF) and S matrix propagation algorithm. As a result, we obtain the distribution of the electric field and diffraction efficiency of any given diffraction order. First, starting with a given MLD mirror, we calculate an etching profile that maximizes the diffraction efficiency at the -1st order by taking into account the manufacturing constraints of future suppliers. Then, we optimize the mirror stack without changing the etching profile. We modify only the first top layers under the grooves. We obtained theoretical designs with the same etching profile and identical diffraction efficiency, associated with different electric field intensity values and expected different laser induced damage thresholds.

SPIE Journal Paper | 21 November 2020 Open Access

Round-robin measurements of the laser-induced damage threshold with sub-picosecond pulses on optical single layers

Laurent Lamaignère, Alexandre Ollé, Marine Chorel, Nadja Roquin, Alexei Kozlov, Brittany Hoffman, James Oliver, Stavros Demos, Laurent Gallais, Raluca Negres, Andrius Melninkaitis

OE, Vol. 60, Issue 03, 031005, (November 2020) https://doi.org/10.1117/12.10.1117/1.OE.60.3.031005

KEYWORDS: Laser damage threshold, Hybrid fiber optics, Laser induced damage, Refractive index, Dielectrics, Optical engineering, Sensors, Environmental sensing, Diagnostics, Beam propagation method

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SPIE Journal Paper | 5 November 2020

Analysis of laser-induced contamination at 515 nm in the sub-ps/MHz regime

Georges Gebrayel El Reaidy, Laurent Gallais

OE, Vol. 60, Issue 03, 031004, (November 2020) https://doi.org/10.1117/12.10.1117/1.OE.60.3.031004

KEYWORDS: Contamination, Absorption, Mirrors, Electroluminescence, Coating, Optical engineering, Laser induced damage, Temperature metrology, Pulsed laser operation, Ultraviolet radiation

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Proceedings Article | 3 December 2019 Presentation

Round-robin measurements of optical coatings laser-induced–damage threshold in the subpicosecond range (Conference Presentation)

Laurent Lamaignère, Alexandre Ollé, Marine Chorel, Nadja Roquin, Alexeï Kozlov, Brittany Hoffman, Stavros Demos, Laurent Gallais, Andrius Melninkaitis

Proceedings Volume 11173, 1117319 (2019) https://doi.org/10.1117/12.2536678

KEYWORDS: Laser damage threshold, Optical coatings, Optical testing, Laser optics, Standards development, Control systems, Optical components, High power lasers, Polarization, Environmental sensing

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Proceedings Article | 26 November 2019 Open Access

Phenomenology and mechanisms of laser damage growth on optical coatings in the sub-ps pulse regime (Conference Presentation)

Laurent Gallais, Alexandre Ollé, Martin Sozet, Laurent Lamaignère

Proceedings Volume 11173, 1117309 (2019) https://doi.org/10.1117/12.2537620

KEYWORDS: Laser induced damage, Optical coatings, Laser processing, Dielectrics, Ultrafast phenomena, Ionization, Resonance enhancement, Diffraction, Laser scattering, Scattering

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Proceedings Article | 16 May 2018 Paper

Laser damage metrology in the sub-ps range for the PETAL facility

Laurent Lamaignère, Martin Sozet, Eric Lavastre, Jérôme Néauport, Nadja Roquin, Laurent Gallais

Proceedings Volume 10713, 107130U (2018) https://doi.org/10.1117/12.2319809

KEYWORDS: Laser induced damage, Mirrors, Laser damage threshold, Laser development, Optical components, Metrology, Laser systems engineering, Optics manufacturing

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Proceedings Article | 23 February 2017 Paper

Laser damage metrology of PETAL optics

Laurent Lamaignère, Martin Sozet, Eric Lavastre, Jérôme Neauport, Nadja Roquin, Laurent Gallais

Proceedings Volume 10084, 100840C (2017) https://doi.org/10.1117/12.2249987

KEYWORDS: Laser induced damage, Resistance, Laser development, Pulsed laser operation, Laser damage threshold, Optical components, Optics manufacturing, Metrology, Mirrors, High power lasers, Laser systems engineering, Beam shaping

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Proceedings Article | 6 December 2016 Paper

Development of a laser damage growth mitigation process, based on CO2 laser micro processing, for the Laser MegaJoule fused silica optics

Thomas Doualle, Laurent Gallais, Serge Monneret, Stephane Bouillet, Antoine Bourgeade, Christel Ameil, Laurent Lamaignère, Philippe Cormont

Proceedings Volume 10014, 1001407 (2016) https://doi.org/10.1117/12.2245148

KEYWORDS: Laser induced damage, Carbon dioxide lasers, Silica, Resistance, Laser processing, Gas lasers, Carbon monoxide, Laser irradiation, Wavefronts, Phase imaging

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Proceedings Article | 6 December 2016 Paper

Electronic quantization in dielectric nanolaminates

T. Willemsen, P. Geerke, M. Jupé, L. Gallais, D. Ristau

Proceedings Volume 10014, 100140C (2016) https://doi.org/10.1117/12.2244828

KEYWORDS: Dielectrics, Refractive index, Composites, Manufacturing, Electrons, Optics manufacturing, Hybrid fiber optics, Quantum wells, Laser damage threshold, Quantization

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Proceedings Article | 6 December 2016 Paper

Laser remote heating in vacuum environment to study temperature dependence of optical properties for bulk materials

Marco Minissale, Regis Bisson, Laurent Gallais

Proceedings Volume 10014, 100141Q (2016) https://doi.org/10.1117/12.2245190

KEYWORDS: Optical properties, High power lasers, Temperature metrology, Molybdenum, Reflectivity, Stereolithography, Tungsten, Spectroscopy, Pyrometry, Metals

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Proceedings Article | 6 December 2016 Paper

Time-resolved microscopy studies of laser damage dynamics at 0.5-1ps, 1030nm

L. Gallais, A. Ollé, M. Sozet, J. Berthelot, S. Monneret, J. Néauport, L. Lamaignère

Proceedings Volume 10014, 1001417 (2016) https://doi.org/10.1117/12.2245150

KEYWORDS: Laser induced damage, Microscopy, Laser beam diagnostics, Microscopes, Silica, Kerr effect, Mirrors, Image processing, Wavefront sensors, Hybrid fiber optics

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SPIE Journal Paper | 17 October 2016

CO₂ laser microprocessing for laser damage growth mitigation of fused silica optics

Thomas Doualle, Laurent Gallais, Serge Monneret, Stéphane Bouillet, Antoine Bourgeade, Christel Ameil, Laurent Lamaignère, Philippe Cormont

OE, Vol. 56, Issue 01, 011022, (October 2016) https://doi.org/10.1117/12.10.1117/1.OE.56.1.011022

KEYWORDS: Wavefronts, Gas lasers, Laser induced damage, Silica, Carbon monoxide, Resistance, Laser processing, Phase imaging, Pulsed laser operation, Optical engineering

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SPIE Journal Paper | 30 June 2016 Open Access

Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics

Adrien Hervy, Laurent Gallais, Gilles Chériaux, Daniel Mouricaud

OE, Vol. 56, Issue 01, 011001, (June 2016) https://doi.org/10.1117/12.10.1117/1.OE.56.1.011001

KEYWORDS: Laser damage threshold, Hybrid fiber optics, Coating, Femtosecond phenomena, Laser induced damage, Resistance, Dielectrics, Refractive index, Silica, Electron beams

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Proceedings Article | 27 April 2016 Paper

Laser damage resistance of optical coatings in the sub-ps regime: limitations and improvement of damage threshold

L. Gallais

Proceedings Volume 9893, 989305 (2016) https://doi.org/10.1117/12.2231532

KEYWORDS: Laser induced damage, Optical coatings, Laser components, Laser damage threshold, Femtosecond phenomena, Electrons, Refractive index, Ionization, Silica, Thin films, Absorption

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Proceedings Article | 23 November 2015 Paper

Heat treatment of fused silica optics repaired by CO2 laser

Thomas Doualle, Laurent Gallais, Philippe Cormont, Jean-Luc Rullier

Proceedings Volume 9632, 963216 (2015) https://doi.org/10.1117/12.2194967

KEYWORDS: Annealing, Silica, Carbon dioxide lasers, Laser induced damage, Heat treatments, Optical components, Thermal effects, Laser damage threshold, Carbon dioxide, Resistance, Glasses

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Proceedings Article | 23 November 2015 Paper

Analysis of energy deposition and damage mechanisms in single layers of HfO2 and Nb2O5 submitted to 500fs pulses

Dam-Bé Douti, Mahmad Chrayteh, Serge Monneret, Mireille Commandré, Laurent Gallais

Proceedings Volume 9632, 96320L (2015) https://doi.org/10.1117/12.2195005

KEYWORDS: Thin film coatings, Laser induced damage, Thin films, Optics manufacturing, Optical coatings, Laser optics, Laser development, Femtosecond phenomena, Laser systems engineering, Electrons, Ionization, Ultraviolet radiation, Interfaces, Optical properties, Absorption, Laser damage threshold, Scanning electron microscopy

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Proceedings Article | 23 November 2015 Paper

What time-resolved measurements tell us about femtosecond laser damage?

Andrius Melninkaitis, Nerijus Šiaulys, Linas Smalakys, Balys Momgaudis, Julius Vaicenavičius, Simona Barkauskaitė, Valdas Sirutkaitis, Laurent Gallais, Stephane Guizard

Proceedings Volume 9632, 96320O (2015) https://doi.org/10.1117/12.2195333

KEYWORDS: Digital holography, Laser induced damage, Thin films, Laser damage threshold, Nonlinear optics, Femtosecond phenomena, Kerr effect, Interferometry, Laser processing, Holography, Silica, Picosecond phenomena, Phase shifts, Spatial resolution, Refractive index, Thin film devices, Solar thermal energy

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Proceedings Article | 23 November 2015 Paper

Laser damage resistance of optical components in sub-picosecond regime in the infrared

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, Laurent Lamaignère

Proceedings Volume 9632, 96320N (2015) https://doi.org/10.1117/12.2194286

KEYWORDS: Optical components, Laser induced damage, Resistance, Optical coatings, Pulsed laser operation, Laser optics, Infrared lasers, High power lasers, Manufacturing, Laser damage threshold, Mirrors, Scanning electron microscopy, Digital image correlation, Optics manufacturing, Infrared radiation, Dielectrics

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Proceedings Article | 11 October 2015 Paper

Process for repairing large scratches on fused silica optics

Philippe Cormont, Antoine Bourgeade, Sandy Cavaro, Thomas Doualle, Gael Gaborit, Laurent Gallais, Jean-Luc Rullier, Daniel Taroux

Proceedings Volume 9633, 96330A (2015) https://doi.org/10.1117/12.2195698

KEYWORDS: Carbon dioxide lasers, Silica, Polishing, Optics manufacturing, Surface finishing, Carbon dioxide, Adaptive optics, Magnetorheological finishing, Neodymium, Laser beam propagation

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Proceedings Article | 2 October 2015 Paper

Analysis of energy deposition and damage mechanisms in single layer optical thin films irradiated by IR and UV femtosecond pulses

Dam Bé Douti, Laurent Gallais, Christophe Hecquet, Thomas Bégou, Julien Lumeau, Mireille Commandré

Proceedings Volume 9627, 962718 (2015) https://doi.org/10.1117/12.2192983

KEYWORDS: Thin films, Ultraviolet radiation, Laser damage threshold, Laser induced damage, Absorption, Silica, Ions, Ionization, UV optics, Femtosecond phenomena

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Proceedings Article | 23 September 2015 Paper

Polishing and coating of a F1250mm 90° off-axis parabola for PW lasers

A. Hervy, A. Dussourd, G. Chaussat, D. Mouricaud, G. Chériaux, L. Gallais, R. Geyl

Proceedings Volume 9627, 962719 (2015) https://doi.org/10.1117/12.2191061

KEYWORDS: Polishing, Coating, Reflectivity, Prototyping, Surface finishing, Manufacturing, Optical components, Thin films, Laser development, Optics manufacturing

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Proceedings Article | 14 July 2015 Paper

Towards two-photon lensless endoscopes: inter-core group delay compensation in a multi-core fiber

Esben Andresen, Siddharth Sivankutty, Géraud Bouwmans, Olivier Vainvinq, Laurent Gallais, Serge Monneret, Hervé Rigneault

Proceedings Volume 9536, 953605 (2015) https://doi.org/10.1117/12.2183676

KEYWORDS: Endoscopes, Wavefronts, Waveguides, Interferometry, Femtosecond phenomena, Endoscopy, Cladding, Image segmentation, Microscopes, Microscopy

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Proceedings Article | 14 July 2015 Paper

Laser damage measurement techniques for the femtosecond regime

D.-B. Douti, M. Chrayteh, A. Melninkaitis, S. Monneret, M. Commandré, L. Gallais

Proceedings Volume 9532, 953219 (2015) https://doi.org/10.1117/12.2185775

KEYWORDS: Laser induced damage, Microscopy, Microscopes, Cameras, Femtosecond phenomena, Phase imaging, Image processing, Laser damage threshold, Optical microscopy, Sensors

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Proceedings Article | 12 May 2015 Paper

Sub-picosecond laser induced damage test facility for petawatt reflective optical components characterizations

Martin Sozet, Jérôme Néauport, Eric Lavastre, Nadja Roquin, Laurent Gallais, Laurent Lamaignère

Proceedings Volume 9513, 951316 (2015) https://doi.org/10.1117/12.2178734

KEYWORDS: Laser induced damage, Optical components, Dielectrics, Reflectivity, Laser damage threshold, Laser development, Resistance, Optical coatings, High power lasers, Fusion energy

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Proceedings Article | 31 October 2014 Paper

Thin films characterizations to design high-reflective coatings for ultrafast high power laser systems

Adrien Hervy, Laurent Gallais, Daniel Mouricaud, Gilles Chériaux, Olivier Utéza, Raphael Clady, Marc Sentis, Antoine Fréneaux

Proceedings Volume 9237, 92370J (2014) https://doi.org/10.1117/12.2068047

KEYWORDS: Laser induced damage, Thin film coatings, Dielectrics, Multilayers, Optical coatings, Laser damage threshold, Refractive index, Pulsed laser operation, Thin films, Ultrafast phenomena

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Proceedings Article | 31 October 2014 Paper

UV to IR laser damage of Magnetron Sputtering films submitted to multiple sub-picosecond pulses

Dam-Bé Douti, Christophe Hecquet, Thomas Bégou, Mireille Commandré, Laurent Gallais

Proceedings Volume 9237, 92370I (2014) https://doi.org/10.1117/12.2068176

KEYWORDS: Silica, Sputter deposition, Ultraviolet radiation, Laser induced damage, Refractive index, Laser damage threshold, Infrared lasers, Thin films, Neodymium, Plasma

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Proceedings Article | 31 October 2014 Paper

In-line quantitative phase imaging for damage detection and analysis

Dam-Bé Douti, Sherazade Aknoun, Serge Monneret, Christophe Hecquet, Mireille Commandré, Laurent Gallais

Proceedings Volume 9237, 92371A (2014) https://doi.org/10.1117/12.2068178

KEYWORDS: Digital image correlation, Cameras, Laser induced damage, Phase imaging, Sensors, Laser damage threshold, Microscopes, Damage detection, Interferometry, Refractive index

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Proceedings Article | 31 October 2014 Paper

Simulations of CO2 laser interaction with silica and comparison to experiments

Thomas Doualle, Laurent Gallais, Philippe Cormont, David Hébert, Patrick Combis, Jean-Luc Rullier

Proceedings Volume 9237, 92371R (2014) https://doi.org/10.1117/12.2068194

KEYWORDS: Silica, Carbon dioxide lasers, Glasses, Laser induced damage, Neodymium, Optical simulations, Laser irradiation, High power lasers, Statistical modeling, Finite element methods

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Proceedings Article | 22 September 2014 Paper

Femtosecond laser-induced damage threshold of electron-beam deposited materials for broadband high-reflective coatings on large optics

Adrien Hervy, Gilles Chériaux, Laurent Gallais, Daniel Mouricaud, Slimane Djidel

Proceedings Volume 9238, 92380A (2014) https://doi.org/10.1117/12.2073242

KEYWORDS: Laser induced damage, Optical coatings, Laser damage threshold, Reflectivity, Dielectrics, Pulsed laser operation, Femtosecond phenomena, Resistance, Optical components, Laser development

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SPIE Journal Paper | 6 August 2014

Laser-induced damage of optical thin films submitted to 343, 515, and 1030 nm multiple subpicosecond pulses

Dam-Bé Douti, Laurent Gallais, Mireille Commandré

OE, Vol. 53, Issue 12, 122509, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122509

KEYWORDS: Thin films, Laser induced damage, Silica, Hybrid fiber optics, Ultraviolet radiation, Laser optics, Laser damage threshold, Absorption, Optical engineering, Niobium

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Proceedings Article | 14 November 2013 Paper

Application of time-resolved digital holographic microscopy to study femtosecond damage process in thin films

Nerijus Šiaulys, Laurent Gallais, Andrius Melninkaitis

Proceedings Volume 8885, 88851A (2013) https://doi.org/10.1117/12.2030351

KEYWORDS: Coating, Digital holography, Thin films, Femtosecond phenomena, Image processing, Ultrafast phenomena, Refractive index, Phase shifts, Holography, Dielectrics

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Proceedings Article | 4 December 2012 Paper

Characterization of scratches on fused silica optics and a way to remove them

P. Cormont, T. Corbineau, Laurent Gallais, C. Hecquet, Laurent Lamaignère, J. Rullier

Proceedings Volume 8530, 853026 (2012) https://doi.org/10.1117/12.976839

KEYWORDS: Laser induced damage, Silica, Confocal microscopy, Carbon dioxide lasers, Polishing, UV optics, Microscopes, Laser damage threshold, Ultraviolet radiation, Solids

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Proceedings Article | 4 December 2012 Paper

Measured nanosecond laser damage probabilities of niobia-silica and zirconia-silica mixtures coatings

Xinghai Fu, Andrius Melninkaitis, Laurent Gallais, Simonas Kičas, Ramutis Drazdys, Valdas Sirutkaitis, Mireille Commandré

Proceedings Volume 8530, 85300X (2012) https://doi.org/10.1117/12.977557

KEYWORDS: Laser induced damage, Silica, Zirconium dioxide, Laser damage threshold, Oxides, Temperature metrology, Resistance, Femtosecond phenomena, Statistical analysis, Optical coatings

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Proceedings Article | 29 November 2012 Paper

An exhaustive study of laser damage in ion beam sputtered pure and mixture oxide thin films at 1030 nm with 500 fs pulse durations

Laurent Gallais, Benoit Mangote, Mireille Commandré, Mathias Mende, Lars Jensen, Henrik Ehlers, Marco Jupé, Detlev Ristau, Andrius Melninkaitis, Valdas Sirutkaitis, Simonas Kičas, Tomas Tolenis, Ramutis Drazdys

Proceedings Volume 8530, 85300K (2012) https://doi.org/10.1117/12.977553

KEYWORDS: Silica, Oxides, Laser induced damage, Refractive index, Thin films, Ion beams, Laser damage threshold, Optical coatings, Zirconium dioxide, Thin film coatings

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SPIE Journal Paper | 13 July 2012

Multipulse laser damage in potassium titanyl phosphate: statistical interpretation of measurements and the damage initiation mechanism

Frank Wagner, Anne Hildenbrand, Hassan Akhouayri, Céline Gouldieff, Laurent Gallais, Mireille Commandré, Jean-Yves Natoli

OE, Vol. 51, Issue 12, 121806, (July 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.12.121806

KEYWORDS: Data modeling, Laser induced damage, Ferroelectric materials, Statistical modeling, Laser damage threshold, Nonlinear crystals, Crystals, Optical engineering, Laser stabilization, Chemical species

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Proceedings Article | 12 January 2012 Paper

Relevance of the choice of diagnostic methods to investigate laser damage resistance in optical material

Jean-Yves Natoli, Frank Wagner, Laurent Gallais, Mireille Commandré

Proceedings Volume 8206, 82061J (2012) https://doi.org/10.1117/12.910429

KEYWORDS: Laser induced damage, Diagnostics, Luminescence, Nondestructive evaluation, Absorption, Silica, Crystals, Resistance, Optical coatings, Nonlinear crystals

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Proceedings Article | 23 November 2011 Paper

Measurement and calculation of ternary oxide mixtures for thin films for ultra short pulse laser optics

M. Jupé, M. Mende, C. Kolleck, D. Ristau, L. Gallais, B. Mangote

Proceedings Volume 8190, 819004 (2011) https://doi.org/10.1117/12.899566

KEYWORDS: Ionization, Solids, Silica, Pulsed laser operation, Temperature metrology, Dielectrics, Laser damage threshold, Thin films, Ions, Oxides

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Proceedings Article | 5 October 2011 Paper

Study of the laser matter interaction in the femtosecond regime: application to the analysis of the laser damage of optical thin films

B. Mangote, L. Gallais, M. Zerrad, M. Commandré, L. Gao, F. Lemarchand, M. Lequime, A. Melninkaitis, J. Mirauskas, V. Sirutkaitis, S. Kicas, T. Tolenis, R. Drazdys, M. Mende, L. Jensen, H. Ehlers, D. Ristau

Proceedings Volume 8168, 816815 (2011) https://doi.org/10.1117/12.897372

KEYWORDS: Laser induced damage, Refractive index, Laser damage threshold, Silica, Thin films, Oxides, Optical coatings, Femtosecond phenomena, Laser optics, Sputter deposition

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Proceedings Article | 6 December 2010 Paper

Multiscale analysis: a way to investigate laser damage precursors in materials for high power applications at nanosecond pulse duration

J. Natoli, F. Wagner, A. Ciapponi, J. Capoulade, L. Gallais, M. Commandré

Proceedings Volume 7842, 784217 (2010) https://doi.org/10.1117/12.855605

KEYWORDS: Laser induced damage, Absorption, Crystals, Coating, Silica, Luminescence, High power lasers, Polishing, Scattering, Raster graphics

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Proceedings Article | 29 November 2010 Paper

The effect of CO2 laser annealing on residual stress and on laser damage resistance for fused silica optics

P. Cormont, L. Gallais, L. Lamaignère, T. Donval, J. Rullier

Proceedings Volume 7842, 78422C (2010) https://doi.org/10.1117/12.867237

KEYWORDS: Carbon dioxide lasers, Annealing, Silica, Laser induced damage, Resistance, Optical components, Ultraviolet radiation, Glasses, National Ignition Facility, Nd:YAG lasers

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Proceedings Article | 29 November 2010 Paper

Investigation of laser damage in single layer coatings with pulse durations from 45fs to 24ps

B. Mangote, L. Gallais, A. Melninkaitis, J. Mirauskas, M. Zerrad, M. Jeskevic, V. Sirutkaitis, M. Commandré

Proceedings Volume 7842, 78420K (2010) https://doi.org/10.1117/12.867506

KEYWORDS: Laser induced damage, Deposition processes, Silica, Laser damage threshold, Optical coatings, Picosecond phenomena, Thin films, Data modeling, Femtosecond phenomena, Scanning electron microscopy

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Proceedings Article | 29 November 2010 Paper

Three-dimensional multiphysical model for the study of photo-induced thermal effects in laser damage phenomena

M. Commandré, G. Demésy, X. Fu, L. Gallais

Proceedings Volume 7842, 78420Q (2010) https://doi.org/10.1117/12.867286

KEYWORDS: Laser induced damage, 3D modeling, Finite element methods, Electromagnetism, Thermal modeling, Thermal effects, Spherical lenses, Optical components, Scattering, Systems modeling

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Proceedings Article | 25 November 2010 Paper

Complex study of zirconia-silica and niobia-silica composite coatings produced by ion beam sputtering

Andrius Melninkaitis, Tomas Tolenis, Lina Mažule, Julius Mirauskas, Valdas Sirutkaitis, Benoit Mangote, Xinghai Fu, Myriam Zerrad, Laurent Gallais, Mireille Commandré, Simonas Kičas, Ramutis Drazdys

Proceedings Volume 7842, 784203 (2010) https://doi.org/10.1117/12.867259

KEYWORDS: Refractive index, Optical coatings, Silica, Zirconium dioxide, Crystals, Composites, Scattering, Ion beams, Light scattering, Atomic force microscopy

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Proceedings Article | 31 December 2009 Paper

Subpicosecond pulse laser damage behavior of dielectric thin films prepared by different techniques

B. Mangote, L. Gallais, M. Commandré, M. Zerrad, J. Natoli, M. Lequime

Proceedings Volume 7504, 75040Q (2009) https://doi.org/10.1117/12.836500

KEYWORDS: Thin films, Laser induced damage, Picosecond phenomena, Laser damage threshold, Interfaces, Ion beams, Dielectrics, Laser development, Electron beams, Sputter deposition

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Proceedings Article | 31 December 2009 Paper

Impact of outgassing organic contamination on laser induced damage of optics

K. Bien-Aimé, A. Pereira, C. Belin, L. Gallais, P. Grua, I. Tovena-Pecault, J. Néauport, E. Fargin

Proceedings Volume 7504, 75040V (2009) https://doi.org/10.1117/12.836384

KEYWORDS: Contamination, Laser induced damage, Silica, Molecules, Liquids, Molecular lasers, Optical components, Optics manufacturing, Polishing, Laser damage threshold

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Proceedings Article | 31 December 2009 Paper

Birefringence and residual stress induced by CO2 laser mitigation of damage growth in fused silica

L. Gallais, P. Cormont, J. Rullier

Proceedings Volume 7504, 75040Z (2009) https://doi.org/10.1117/12.836238

KEYWORDS: Silica, Laser induced damage, Carbon dioxide lasers, Birefringence, Photoelasticity, Resistance, Microscopy, Statistical analysis, Nd:YAG lasers, Thermal modeling

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Proceedings Article | 30 December 2008 Paper

Statistical interpretation of S-on-1 data and the damage initiation mechanism

Frank Wagner, Anne Hildenbrand, Laurent Gallais, Hassan Akhouayri, Mireille Commandre, Jean-Yves Natoli

Proceedings Volume 7132, 71320Y (2008) https://doi.org/10.1117/12.804422

KEYWORDS: Data modeling, Laser induced damage, Statistical modeling, Ferroelectric materials, Laser damage threshold, Nonlinear crystals, Pulsed laser operation, Crystals, Nd:YAG lasers, Laser stabilization

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Proceedings Article | 25 September 2008 Paper

Non-destructive evaluation on optical components for high power density applications

Jean-Yves Natoli, Frank Wagner, A. Ciapponi, S. Palmier, Laurent Gallais, Mireille Commandré

Proceedings Volume 7101, 710118 (2008) https://doi.org/10.1117/12.797485

KEYWORDS: Luminescence, Absorption, Coating, Laser induced damage, Silica, Interfaces, Gold, Laser damage threshold, Particles, Diagnostics

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Proceedings Article | 25 September 2008 Paper

Characterizations of UV-laser damage on fused silica surfaces

Philippe Cormont, Stéphanie Palmier, Bertrand Bertussi, Roger Courchinoux, Gael Gaborit, Laurent Gallais, Laurent Lamaignère, Philippe Legros, Jean-Luc Rullier, Hervé Bercegol

Proceedings Volume 7102, 71020U (2008) https://doi.org/10.1117/12.797407

KEYWORDS: Excimer lasers, Confocal microscopy, Pulsed laser operation, Nd:YAG lasers, Silica, Laser induced damage, Polishing, Excimers, Mirrors, Laser development

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Proceedings Article | 25 September 2008 Paper

Theoretical and experimental analysis of the laser irradiation parameters influence on the LIDT of optical coatings

Laurent Gallais, Jérémie Capoulade, Jean-Yves Natoli, Mireille Commandré

Proceedings Volume 7101, 710117 (2008) https://doi.org/10.1117/12.797709

KEYWORDS: Laser induced damage, Hafnium, Optical coatings, Absorption, Thin films, Laser irradiation, Laser damage threshold, Spherical lenses, Electron beams, Ions

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Proceedings Article | 20 December 2007 Paper

Laser damage of silica and hafnia thin films made with different deposition technologies

Laurent Gallais, Jérémie Capoulade, Jean-Yves Natoli, Mireille Commandré, Michel Cathelinaud, Cian Koc, Michel Lequime

Proceedings Volume 6720, 67200S (2007) https://doi.org/10.1117/12.752952

KEYWORDS: Laser induced damage, Silica, Laser damage threshold, Thin film coatings, Thin films, Ions, Hybrid fiber optics, Optical coatings, Ion beams, Sputter deposition

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SPIE Journal Paper | 1 February 2007

Influence of polishing and cleaning on the laser-induced damage threshold of substrates and coatings at 1064 nm

Helene Krol, Laurent Gallais, Mireille Commandré, Catherine Grèzes-Besset, Didier Torricini, Guy Lagier

OE, Vol. 46, Issue 02, 023402, (February 2007) https://doi.org/10.1117/12.10.1117/1.2542122

KEYWORDS: Polishing, Laser induced damage, Silica, Resistance, Laser damage threshold, Optical coatings, Thin films, Tantalum, Thin film coatings, Antireflective coatings

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Proceedings Article | 23 January 2007 Paper

Laser damage on diffractive optics

Laurent Gallais, Guillaume Demesy, Mireille Commandré, Stéphane Tisserand, Sophie Gauthier, Fabien Reversat, Marc Hubert

Proceedings Volume 6403, 640304 (2007) https://doi.org/10.1117/12.695413

KEYWORDS: Mirrors, Laser induced damage, Coating, Etching, Microscopy, Raster graphics, High power lasers, Atomic force microscopy, Computer simulations, Computer programming

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Proceedings Article | 15 January 2007 Paper

Study of laser-induced damage at 2 microns on coated and uncoated ZnSe substrates

Hélène Krol, Catherine Grèzes-Besset, Laurent Gallais, Jean-Yves Natoli, Mireille Commandré

Proceedings Volume 6403, 640316 (2007) https://doi.org/10.1117/12.695742

KEYWORDS: Laser induced damage, Polishing, Infrared radiation, Optical coatings, Surface finishing, Optical components, Zinc, Abrasives, Infrared lasers, Infrared coatings

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Proceedings Article | 15 January 2007 Paper

Optical characterization in laser damage studies

Mireille Commandré, Jean Yves Natoli, Laurent Gallais, Frank Wagner, Claude Amra

Proceedings Volume 6403, 64031D (2007) https://doi.org/10.1117/12.696556

KEYWORDS: Absorption, Gold, Silica, Laser induced damage, Laser beam diagnostics, Microscopes, Microscopy, Modulation, Particles, Spatial resolution

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Proceedings Article | 7 February 2006 Paper

Luminescence, absorption and morphology studies of laser-damage sites in silica glasses and coatings

Laurent Gallais, Jeremie Capoulade, Frank Wagner, Helene Krol, Jean-Yves Natoli, Mireille Commandre, Saidislam Kurbanov

Proceedings Volume 5991, 59910A (2006) https://doi.org/10.1117/12.638767

KEYWORDS: Luminescence, Silica, Absorption, Laser induced damage, Thin films, Glasses, Thin film coatings, Microscopy, Microscopes, Oxygen

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Proceedings Article | 7 February 2006 Paper

Development of 2-µm laser damage test facility

Hélène Krol, Laurent Gallais, Jean-Yves Natoli, Catherine Grèzes-Besset, Mireille Commandré

Proceedings Volume 5991, 599129 (2006) https://doi.org/10.1117/12.638736

KEYWORDS: Laser induced damage, Infrared radiation, Laser development, Infrared lasers, Crystals, Nonlinear crystals, Dye lasers, Metrology, YAG lasers, Optical components

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Proceedings Article | 5 October 2005 Paper

Comparative study of IR and UV laser damage resistance of silica thin films deposited by Electron Beam deposition, Ion Plating, Ion Assisted Deposition and Dual Ion Beam Sputtering

Laurent Gallais, Hélène Krol, Jérémie Capoulade, Michel Cathelinaud, Luc Roussel, Gérard Albrand, Jean-Yves Natoli, Mireille Commandré, Michel Lequime, Claude Amra

Proceedings Volume 5963, 59630Z (2005) https://doi.org/10.1117/12.624643

KEYWORDS: Laser induced damage, Thin films, Laser damage threshold, Resistance, Silica, Ions, Electron beams, Plating, Ion beams, Sputter deposition

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Proceedings Article | 5 October 2005 Paper

LIDT improvement of multilayer coatings by accurate analysis of fabrication steps

Hélène Krol, Laurent Gallais, Mireille Commandré, Catherine Grèzes-Besset, Didier Torricini, Guy Lagier

Proceedings Volume 5963, 596311 (2005) https://doi.org/10.1117/12.625186

KEYWORDS: Polishing, Laser induced damage, Resistance, Silica, Multilayers, Tantalum, Optical coatings, Antireflective coatings, Laser damage threshold, Surface finishing

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Proceedings Article | 21 February 2005 Paper

Threshold distribution determination of laser-induced damage precursors in optical coatings and substrates

Helene Krol, Laurent Gallais, Bertrand Bertussi, Jean Yves Natoli, Catherine Grezes-Besset, Mireille Commandre, Claude Amra

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.585260

KEYWORDS: Probability theory, Laser induced damage, Laser damage threshold, Optical coatings, Optical components, Data modeling, Polishing, Statistical analysis, Laser metrology, Surface finishing

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Proceedings Article | 10 June 2004 Paper

Size and complex index of nanocenters: optical measurements

Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Mireille Commandre, Claude Amra

Proceedings Volume 5273, (2004) https://doi.org/10.1117/12.524397

KEYWORDS: Particles, Laser induced damage, Absorption, Silica, Thin films, Optical testing, Laser damage threshold, Refractive index, Dielectrics, Spherical lenses

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Proceedings Article | 25 February 2004 Paper

Correlation between laser-induced damage and nanosized absorbing defects

Bertrand Bertussi, Jean-Yves Natoli, Annelise During, Mireille Commandre, Laurent Gallais, Jean Luc Rullier, Herve Bercegol, Philippe Bouchut

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513373

KEYWORDS: Particles, Gold, Absorption, Microscopes, Silica, Laser induced damage, Laser applications, Optical components, Laser development, Pulsed laser operation

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Proceedings Article | 25 February 2004 Paper

Method for the optical measurement of size and complex index of laser damage precursors in optical components

Laurent Gallais, Philippe Voarino, Jean-Yves Natoli, Claude Amra

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513414

KEYWORDS: Laser induced damage, Particles, Absorption, Silica, Laser damage threshold, Thin films, Optical testing, Dielectrics, Thermal modeling, Optical components

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Proceedings Article | 25 February 2004 Paper

Photothermal facility for optical characterization of DUV materials

Laurent Gallais, Hauke Hinsch, Man-Long Lay, Mireille Commandre

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513405

KEYWORDS: Absorption, Calibration, Luminescence, Silica, Scattering, Laser beam diagnostics, Thin films, Deep ultraviolet, Laser scattering, Ions

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Proceedings Article | 25 February 2004 Paper

Multiple-pulse laser irradiation study in silica: comparison between 1064 and 355 nm

Jean-Yves Natoli, Bertrand Bertussi, Laurent Gallais, Mireille Commandre, Claude Amra

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513377

KEYWORDS: Laser induced damage, Silica, Laser damage threshold, Laser irradiation, Data modeling, Pulsed laser operation, Statistical modeling, Lead, Optical components, Glasses

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Proceedings Article | 4 November 2003 Paper

Photothermal microscopy and laser damage in optical components

Mireille Commandre, Jean Yves Natoli, Claude Amra, Annelise During, Laurent Gallais

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505890

KEYWORDS: Laser induced damage, Microscopy, Optical components, Silica, Optical semiconductors, Semiconductors, Nanotechnology, High power lasers, Light emitting diodes, Spatial resolution

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