Prof. Lianhua Jin Profile

Prof. Lianhua Jin

Professor at Univ of Yamanashi

SPIE Involvement:

Conference Program Committee | Author

Publications (22)

Proceedings Article | 20 September 2023 Paper

Reflection and transmission ellipsometry measurement under incoherent superposition of light

Yoriatsu Kitamura, Sota Mogi, Tsutomu Muranaka, Keisuke Arimoto, Eiichi Kondoh, Lianhua Jin, Bernard Gelloz

Proceedings Volume 12607, 126070M (2023) https://doi.org/10.1117/12.3005554

KEYWORDS: Reflection, Ellipsometry, Film thickness, Refractive index, Quartz, Optical transmission, Silicon films, Light sources and illumination, Glasses, Thin films

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Proceedings Article | 19 November 2021 Paper

Aberration analysis of zoom lens system with freeform surface lenses using XY polynomial

Motoyuki Ohtake, Masato Shibuya, Lianhua Jin

Proceedings Volume 12078, 120781H (2021) https://doi.org/10.1117/12.2603668

KEYWORDS: Zoom lenses, Lenses, Freeform optics, Modulation transfer functions, Distortion, Augmented reality, Solids, Objectives, Modulation, Medicine

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Proceedings Article | 27 October 2021 Paper

3D profile measurement of openings with optical caliper

Lianhua Jin, Takuma Ashizawa, Toru Yoshizawa

Proceedings Volume 11927, 119270A (2021) https://doi.org/10.1117/12.2616254

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Proceedings Article | 10 October 2020 Presentation + Paper

Optical profilometry of cylindrical openings for transparent objects

Lianhua Jin, Takumi Mukai, Toru Yoshizawa

Proceedings Volume 11552, 115520M (2020) https://doi.org/10.1117/12.2575305

KEYWORDS: Beam shaping, Optical testing, Image sensors, Light scattering, Opacity, Translucency, Sensors, Reflection, Laser scattering, Scattering

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Proceedings Article | 20 August 2020 Presentation + Paper

Design of a thin see-though optical viewer with a freeform surface

Motoyuki Ohtake, Masato Shibuya, Lianhua Jin

Proceedings Volume 11500, 115000G (2020) https://doi.org/10.1117/12.2571088

KEYWORDS: Prisms, Zernike polynomials, Relays, Freeform optics, Aberration correction, Distortion, Mirrors, Glasses, Monochromatic aberrations

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Proceedings Article | 15 June 2020 Paper

Design of a spectroscopic imaging ellipsometer

Lianhua Jin, Makoto Uehara, Yuki Iizuka, Eiichi Kondoh, Bernard Gelloz

Proceedings Volume 11523, 115230H (2020) https://doi.org/10.1117/12.2574762

KEYWORDS: Imaging systems, Imaging spectroscopy, Spectroscopy, Ellipsometry, Image sensors, Calibration, Optical testing, Optical microscopy, Optical components, Spatial resolution

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Proceedings Article | 2 November 2018 Paper

Extraction of properties of individual component for the retarder-linear diattenuator-retarder system and its application

Lianhua Jin, Eiichi Kondoh, Hiroyuki Kowa, Bernard Gelloz

Proceedings Volume 10819, 108190R (2018) https://doi.org/10.1117/12.2500465

KEYWORDS: Dielectric polarization, Prisms, Wave plates, Beam splitters, Dielectrics, Coating, Multilayers, Polarizers, Polarimetry

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Proceedings Article | 2 November 2018 Paper

Dimensional measurement of internal profile using the optical caliper

Lianhua Jin, Nobuto Miyatsu, Eiichi Kondoh, Bernard Gelloz, Naobumi Kanazawa, Toru Yoshizawa

Proceedings Volume 10819, 108190K (2018) https://doi.org/10.1117/12.2501027

KEYWORDS: Geometrical optics, Image filtering, Optical testing, Image processing, Optics manufacturing, Optical instrument design

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Proceedings Article | 10 September 2011 Paper

Polarization analysis of scattering light using a facet model

Lianhua Jin, Takashi Tsutaki, Bernard Gelloz

Proceedings Volume 8160, 81600F (2011) https://doi.org/10.1117/12.893260

KEYWORDS: Light scattering, Scattering, Polarization, Surface finishing, Reflection, Virtual reality, Refractive index, Diffusers, Glasses, Polishing

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Proceedings Article | 31 December 2010 Paper

Tunable electro-optic crystal Fabry-Perot filter

Lianhua Jin, Eiichi Kondoh, Kuniharu Takizawa

Proceedings Volume 7544, 75443S (2010) https://doi.org/10.1117/12.885558

KEYWORDS: Crystals, Electronic filtering, Optical filters, Electro optics, Geometrical optics, Tunable filters, Modulators, Fabry–Perot interferometers, Polarization, Mirrors

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Proceedings Article | 10 September 2009 Paper

Stokes parameters of reflected and scattered light by a rough surface

Lianhua Jin, Kuniharu Takizawa

Proceedings Volume 7432, 74320B (2009) https://doi.org/10.1117/12.828030

KEYWORDS: Scattering, Light scattering, Polarization, Laser scattering, Ellipsometry, Specular reflections, Modulators, Modulation, Polishing, Surface finishing

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SPIE Journal Paper | 1 September 2008

Performance of a television camera system for the detection of oil slicks

Kuniharu Takizawa, Lianhua Jin, Yoshihiro Yoshida, Kazuya Yonekura

OE, Vol. 47, Issue 09, 093801, (September 2008) https://doi.org/10.1117/12.10.1117/1.2981410

KEYWORDS: Cameras, Imaging systems, Glasses, CCD cameras, Aluminum, Fermium, Frequency modulation, Sensing systems, Image processing, Video

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Proceedings Article | 9 December 2005 Paper

Development of television camera for detecting oil film floating on the ocean

Lianhua Jin, Yoshihiro Yoshida, Kuniharu Takizawa

Proceedings Volume 6024, 60240R (2005) https://doi.org/10.1117/12.666833

KEYWORDS: CCD cameras, Charge-coupled devices, Glasses, Cameras, Quantum efficiency, Sensing systems, Coating, Imaging systems, Ocean optics, Aluminum

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SPIE Journal Paper | 1 January 2004

Measurement of characteristics of magnetic fluid by the Mueller matrix imaging polarimeter

Lianhua Jin, Takayuki Hamada, Yukitoshi Otani, Norihiro Umeda

OE, Vol. 43, Issue 01, (January 2004) https://doi.org/10.1117/12.10.1117/1.1631001

KEYWORDS: Magnetism, Polarimetry, Wave plates, Optical activity, Polarization, Optical components, CCD cameras, Sensors, Particles, Linear polarizers

Proceedings Article | 4 November 2003 Paper

Image detection system for 157 nm using fluorescent glass

Yukitoshi Otani, Masakatsu Takahashi, Lianhua Jin, Hiroyuki Kowa, Norihiro Umeda

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.506755

KEYWORDS: Glasses, Ultraviolet radiation, Visible radiation, Sensors, Vacuum ultraviolet, Interferometers, Lithography, CCD cameras, Terbium, Birefringence

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Proceedings Article | 4 November 2003 Paper

Mueller matrix polarimeter in 157 nm

Lianhua Jin, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.507038

KEYWORDS: Polarimetry, Birefringence, Optical components, Error analysis, Sensors, Luminescence, Glasses, Ultraviolet radiation, Calcium, Lithography

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Proceedings Article | 20 September 2002 Paper

Measurement of characteristics of magnetic fluid by Mueller matrix imaging polarimeter

Lianhua Jin, Takayuki Hamada, Yukitoshi Otani

Proceedings Volume 4919, (2002) https://doi.org/10.1117/12.465726

KEYWORDS: Magnetism, Polarimetry, Wave plates, Sensors, Statistical analysis, Optical properties, CCD cameras, Polarizers, Particles, Polarization

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Proceedings Article | 20 September 2002 Paper

Two-dimensional birefringence measurement using liquid crystal retarder for plastic disk inspection

Yukitoshi Otani, Lianhua Jin, Yuki Sakaino

Proceedings Volume 4919, (2002) https://doi.org/10.1117/12.465750

KEYWORDS: Birefringence, Liquid crystals, Wave plates, Inspection, Optical discs, Phase shifting, CCD cameras, Digital video discs, Polarizers, Thin films

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SPIE Journal Paper | 1 July 2001

Shadow moire profilometry by frequency sweeping

Lianhua Jin, Yukitoshi Otani, Toru Yoshizawa

OE, Vol. 40, Issue 07, (July 2001) https://doi.org/10.1117/12.10.1117/1.1385170

KEYWORDS: Light sources, Aluminum, Moire patterns, Fourier transforms, Semiconductor lasers, CCD cameras, Modulation, Optical engineering, Distance measurement, Computing systems

Proceedings Article | 9 October 2000 Paper

Shadow moire profilometry by frequency sweeping

Lianhua Jin, Yukitoshi Otani, Toru Yoshizawa

Proceedings Volume 4221, (2000) https://doi.org/10.1117/12.402589

KEYWORDS: Moire patterns, Fourier transforms, Ytterbium, Light sources, Aluminum, Semiconductor lasers, CCD cameras, Modulation, Distance measurement, Computing systems

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SPIE Journal Paper | 1 August 2000

Shadow moire profilometry using the phase-shifting method

Lianhua Jin, Yutaka Kodera, Toru Yoshizawa, Yukitoshi Otani

OE, Vol. 39, Issue 08, (August 2000) https://doi.org/10.1117/12.10.1117/1.1305468

KEYWORDS: Phase shifts, Image processing, CCD cameras, Light sources, Moire patterns, Phase shifting, Optical engineering, Computing systems, 3D image processing, Aluminum

Proceedings Article | 7 May 1999 Paper

Shadow moire profilometry using a phase-shifting method

Lianhua Jin, Yutaka Kodera, Toru Yoshizawa, Yukitoshi Otani

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347777

KEYWORDS: Moire patterns, Phase shifts, CCD cameras, Light sources, Silicon, Lithium, Aluminum, Phase shifting, Focus stacking software, Osmium

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Showing 5 of 22 publications

Conference Committee Involvement (16)

Optical Metrology and Inspection for Industrial Applications XII

12 October 2025 | Beijing, China

Optical Technology and Measurement for Industrial Applications Conference

21 April 2025 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications XI

12 October 2024 | Nantong, Jiangsu, China

Optical Technology and Measurement for Industrial Applications Conference

22 April 2024 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications X

15 October 2023 | Beijing, China

Optical Technology and Measurement for Industrial Applications Conference

17 April 2023 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications IX

5 December 2022 | Online Only, China

Optical Technology and Measurement for Industrial Applications Conference 2022

18 April 2022 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications VIII

11 October 2021 | Nantong, JS, China

Optical Technology and Measurement for Industrial Applications Conference

20 April 2021 | Online, Japan

Optical Metrology and Inspection for Industrial Applications VII

12 October 2020 | Online Only, China

Optical Technology and Measurement for Industrial Applications Conference

22 April 2020 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications VI

21 October 2019 | Hangzhou, China

Optical Technology and Measurement for Industrial Applications Conference

23 April 2019 | Yokohama, Japan

Optical Metrology and Inspection for Industrial Applications II

5 November 2012 | Beijing, China

Optical Metrology and Inspection for Industrial Applications

18 October 2010 | Beijing, China

Showing 5 of 16 Conference Committees

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