Ms. Maria Ruzzarin Profile

Maria Ruzzarin

at Univ degli Studi di Padova

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Publications (1)

Proceedings Article | 1 March 2019 Presentation + Paper

Degradation physics of GaN-based lateral and vertical devices

Matteo Meneghini, Carlo De Santi, Alessandro Barbato, Matteo Borga, Eleonora Canato, Francesca Chiocchetta, Elena Fabris, Fabrizio Masin, Arianna Nardo, Fabiana Rampazzo, Maria Ruzzarin, Alaleh Tajalli, Marco Barbato, Gaudenzio Meneghesso, Enrico Zanoni

Proceedings Volume 10918, 1091817 (2019) https://doi.org/10.1117/12.2511145

KEYWORDS: Gallium nitride, Transistors, Reliability, Field effect transistors, Failure analysis, Diodes, Dielectrics, Diffusion, Physics, Microscopy

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