Mark Farris
Engineer at Teledyne Imaging Sensors
SPIE Involvement:
Author
Publications (30)

Proceedings Article | 23 August 2024 Poster + Paper
Gregory Mosby, Synthia Tonn, Jay Chervenak, Bob Hill, Majid Zandian, Bernie Rauscher, Jeff Kruk, Mat Samuel, John Auyeung, Randy Kimble, Matt Greenhouse, Josh Schlieder, Ed Cheng, Craig Cabelli, Eric Piquette, Jianmei Pan, Murzy Jhabvala, Alan Abeel, Mark Farris, Anders Petersen, John Gygax, Mario Cabrera, Michael Hickey, Colin Stuart, Analia Cillis, Stephanie Cheung, Nibir Dhar
Proceedings Volume 13092, 130923K (2024) https://doi.org/10.1117/12.3020366
KEYWORDS: Dark current, Sensors, Diffusion, Space telescopes, Mosaic detectors, Mercury cadmium telluride, Activation energy

SPIE Journal Paper | 24 June 2024
JATIS, Vol. 10, Issue 02, 026007, (June 2024) https://doi.org/10.1117/12.10.1117/1.JATIS.10.2.026007
KEYWORDS: Sensors, Crosstalk, Signal to noise ratio, Signal detection, Field effect transistors, Interference (communication), Resistors, Equipment, Observatories, Cryogenics

Proceedings Article | 30 September 2022 Presentation + Paper
Michael Grzesik, Jongwoo Kim, Henry Yuan, Mark Farris, Kevin Peralta, Luis Gordillo
Proceedings Volume 12234, 1223406 (2022) https://doi.org/10.1117/12.2636081
KEYWORDS: Indium gallium arsenide, Staring arrays, Sensors, Cameras, Short wave infrared radiation, Semiconducting wafers, Readout integrated circuits, Quantum efficiency, Inspection

Proceedings Article | 29 August 2022 Presentation + Paper
Proceedings Volume 12191, 121911V (2022) https://doi.org/10.1117/12.2629660
KEYWORDS: Sensors, Quantum efficiency, Infrared radiation, Detector development, Defense and security, Long wavelength infrared, Infrared detectors, Signal detection, Optical sensors

Proceedings Article | 29 August 2022 Presentation + Paper
W. Holmes, H. Aghakians, S. Avasapian, A. Bahraman, A. Berg, A. Beyer, E. Boehmer, R. Calvet, S. Cheung, B. Cho, H. Cho, A. Cillis, L. DelCastillo, M. Dickie, G. Delo, M. Farris, A. Feizi, N. Ferraro, L. Fischer, R. Foltz, N. Hambarsoumian, K. Hong, T. Huang, M. Jhabvala, Er. Kan, R. Kopp, B. Krohn, D. Lewis, M. Loose, K. MacNeal, J. Maiten, D. Markley, G. Maldonado, J. Mehta, J. Melendez, A. Morgan, J. Mulder, M. Ngyuen, N. Ovee, M. Pniel, S. Pravdo, D. Randall, J. Riendeau, A. Runkle, M. Runyan, M. Seiffert, M. Skalare, P. Tan, A. Turner, S. Van Nostrand, A. Waczynski, J. Wu
Proceedings Volume 12191, 121911U (2022) https://doi.org/10.1117/12.2629611
KEYWORDS: Cryogenics, Electronics, Reliability, Aluminum, Silicon, Interfaces, Packaging, Analog electronics, Temperature metrology, Gold

Showing 5 of 30 publications
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