Dr. Matthew C. Tai
at Univ of Technology Sydney
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 23 October 2021
JPE, Vol. 11, Issue 04, 042111, (October 2021) https://doi.org/10.1117/12.10.1117/1.JPE.11.042111
KEYWORDS: Polarization, Switching, Oxidation, Reflectors, Vanadium, Temperature metrology, FT-IR spectroscopy, Infrared radiation, Thermography, Switches

Proceedings Article | 17 September 2018 Paper
Proceedings Volume 10759, 107590L (2018) https://doi.org/10.1117/12.2323877
KEYWORDS: Temperature metrology, Vanadium, Nanostructured thin films, Thin films, Infrared radiation, Oxidation, Annealing, Reflectivity, Ellipsometry, Reflection

Proceedings Article | 30 August 2017 Presentation + Paper
Proceedings Volume 10356, 103560L (2017) https://doi.org/10.1117/12.2273528
KEYWORDS: Anisotropy, Birefringence, Silicon, Nanostructures, Silicon films, Thin films, Polarization, Optical filters, Wave plates, Polarimetry

Proceedings Article | 22 December 2015 Paper
Proceedings Volume 9668, 96683S (2015) https://doi.org/10.1117/12.2202278
KEYWORDS: Silver, Aluminum, Refractive index, Optical spheres, Optical properties, Metals, Spherical lenses, Monte Carlo methods, Artificial intelligence, Plasmonics

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