Dr. Oliver Brunke Profile

Dr. Oliver Brunke

at Waygate Technologies, a Baker Hughes Business

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 20 September 2010 Paper

Precise 3D dimensional metrology using high-resolution x-ray computed tomography (muCT)

Oliver Brunke, Javier Santillan, Alexander Suppes

Proceedings Volume 7804, 78040O (2010) https://doi.org/10.1117/12.861354

KEYWORDS: Optical spheres, Metrology, X-rays, Calibration, Distance measurement, 3D metrology, Dimensional metrology, Inspection, X-ray computed tomography, Computed tomography

Read Abstract +

Over the past decade computed tomography (CT) with conventional x-ray sources has evolved from an imaging method in medicine to a well established technology for industrial applications in fields such as material science, light metals and plastics processing, microelectronics and geology. By using modern microfocus and nanofocus X-ray tubes, parts can be scanned with sub-micrometer resolutions. Currently, micro-CT is a technology increasingly used for metrology applications in the automotive industry. CT offers big advantages compared with conventional tactile or optical coordinate measuring machines (CMMs). This is of greater importance if complex parts with hidden or difficult accessible surfaces have to be measured. In these cases, CT offers the advantage of a high density of measurement points and a non-destructive and fast capturing of the sample's complete geometry. When using this growing technology the question arises how precise a μCT based CMM can measure as compared to conventional and established methods for coordinate measurements. For characterizing the metrological capabilities of a tactile or optical CMM, internationally standardized parameters like length measurement error and probing error are defined and used. To increase the acceptance of CT as a metrological method, our work seeks to clarify the definition and usage of parameters used in the field of metrology as these apply to CT. In this paper, an overview of the process chain in CT based metrology will be given and metrological characteristics will be described. For the potential user of CT as 3D metrology tool it is important to show the measurement accuracy and repeatability on realistic samples. Following a discussion of CT metrology techniques, two samples are discussed. The first compares a measured CT Data set to CAD data using CMM data as a standard for comparison of results. The second data second realistic data set will compare the results of applying both the CMM method of measurement and the CT method of measurement within the same CT data set. A comparison of these results to the data obtained by means of CT shows that state of the art high resolution CT can provide measurement accuracy on the order of established coordinate measurement techniques.

Proceedings Article | 16 September 2008 Paper

Comparison between x-ray tube-based and synchrotron radiation-based μCT

Oliver Brunke, Kathleen Brockdorf, Susanne Drews, Bert Müller, Tilman Donath, Julia Herzen, Felix Beckmann

Proceedings Volume 7078, 70780U (2008) https://doi.org/10.1117/12.794789

KEYWORDS: Absorption, X-rays, Spatial resolution, X-ray computed tomography, Bone, Computed tomography, Synchrotrons, Synchrotron radiation, Copper, Sensors

Read Abstract +

Proceedings Article | 15 September 2008 Paper

Comparative micro computed tomography study of a vertebral body

Susanne Drews, Felix Beckmann, Julia Herzen, Oliver Brunke, Phil Salmon, Sebastian Friess, Andres Laib, Bruno Koller, Thomas Hemberger, Magdalena Müller-Gerbl, Bert Müller

Proceedings Volume 7078, 70780C (2008) https://doi.org/10.1117/12.793815

KEYWORDS: Bone, Cartilage, Tissues, Absorption, X-rays, 3D modeling, Polymethylmethacrylate, Spatial resolution, Computed tomography, Image segmentation

Read Abstract +