Samuel P. Sadoulet
CEO at Edmund Optics Inc
SPIE Involvement:
Executive Advisory Group (EAG) | Financial Advisory Committee | Author | Startup Challenge Judge
Profile Summary

Samuel Sadoulet is a Global Business Executive who brings the strong combination of financial acumen and expertise in operations, manufacturing, engineering and technology, and ability to catalyze cross-cultural engagement. He leads Edmund Optics, a worldwide leader in optical and imaging technology, as its Chief Executive Officer. With more than 1,200 employees across 15 major sites across North America, Europe and Asia, Edmund Optics serves more than 125,000 active customers with approximately 30,000 products across the life sciences, industrial inspection, semiconductor, R&D and defense industries.

Samuel has extensive Board of Directors experience and is an industry leader and spokesperson. He serves as a strategic advisor and Board Member to several companies across the photonics and biomedical industries. He chairs the Executive Advisory Group for SPIE, the international association for photonics. He is a sought-after author of articles, seminar lecturer and expert panel member, and regularly guest lectures at prestigious universities.

Samuel earned an MBA at INSEAD, an MS in Optical Engineering at the University of Arizona and a BS in Physics at the University of Rochester. He has completed advanced HR coursework in Talent Management at Cornell University ILR School. He is a Fellow of SPIE, a Member of Optica (formerly OSA) and a Member of A3 (Association for Advancing Automation).

Sam lives in the greater Philadelphia, PA, area with his wife and four children. Outside of work, he enjoys traveling the world, skiing, windsurfing and biking.

Publications (2)

Proceedings Article | 18 September 2007 Paper
Proceedings Volume 6667, 666705 (2007) https://doi.org/10.1117/12.734447
KEYWORDS: Sensors, Colorimetry, Lens design, Modulation transfer functions, Imaging systems, CCD image sensors, Monochromatic aberrations, Cameras, Geometrical optics, Signal to noise ratio

Proceedings Article | 2 May 2005 Paper
Proceedings Volume 10315, 103150N (2005) https://doi.org/10.1117/12.609596
KEYWORDS: Modulation transfer functions, Imaging systems, Error analysis, Optical fabrication, Personal digital assistants, Metrology, Sensors

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