CONFERENCE PROCEEDINGS
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Dr. Sang-Ho Seo
at Kyungpook National Univ
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Publications (5)
Proceedings Article | 2 March 2020 Paper
CMOS active pixel sensor with adjustable sensitivity using MOSFET-type photodetector with a built-in transfer gate
Proceedings Volume 11287, 112871J (2020) https://doi.org/10.1117/12.2556234
KEYWORDS: Photodetectors, Electrons, Active sensors, CMOS sensors, Sensors, Copper indium disulfide, Cameras, Photodiodes, Surveillance, Cell phones
Proceedings Article | 26 January 2010 Paper
Dynamic range extension of an active pixel sensor by combining output signals from photodiodes with different sensitivities
Jae-Sung Kong, Sung-Hyun Jo, Kyung-Hwa Choi, Sang-Ho Seo, Pyung Choi, Jang-Kyoo Shin
Proceedings Volume 7536, 75360T (2010) https://doi.org/10.1117/12.847994
KEYWORDS: Photodiodes, Sensors, Active sensors, Transistors, Image sensors, Signal processing, Image processing, Capacitors, Charge-coupled devices, Switches
Proceedings Article | 30 December 2008 Paper
Extension of high-illumination level dynamic range for CMOS active pixel sensors
Proceedings Volume 7268, 72681T (2008) https://doi.org/10.1117/12.816721
KEYWORDS: CMOS sensors, Sensors, Active sensors, Field effect transistors, Capacitors, Image processing, Photodiodes, Cameras, Charge-coupled devices, Image quality standards
Proceedings Article | 21 February 2007 Paper
A CMOS vision chip for a contrast-enhanced image using a logarithmic APS and a switch-selective resistive network
Jae-Sung Kong, Sang-Heon Kim, Dong-Kyu Sung, Sang-Ho Seo, Jang-Kyoo Shin
Proceedings Volume 6501, 650110 (2007) https://doi.org/10.1117/12.703769
KEYWORDS: Photodetectors, Retina, Field effect transistors, Switches, Image processing, Analog electronics, Edge detection, Signal processing, Image filtering, Image enhancement
Proceedings Article | 21 February 2007 Paper
Highly sensitive and area-efficient CMOS image sensor using a PMOSFET-type photodetector with a built-in transfer gate
Sang-Ho Seo, Kyoung-Do Kim, Jae-Sung Kong, Jang-Kyoo Shin, Pyung Choi
Proceedings Volume 6501, 650111 (2007) https://doi.org/10.1117/12.703770
KEYWORDS: Photodetectors, Field effect transistors, CMOS sensors, Optical instrument design, Sensors, Standards development, Image quality standards, CMOS technology, Active sensors, Imaging systems
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