Laser-damage performance of optics is known to be negatively affected by microscale particle contamination induced by the operational environment. In this work, we discuss our approach to quantifying particulates found inside the grating compressor chamber in the OMEGA EP Laser System. Particulate was collected at specific locations near multilayer dielectric (MLD) gratings and MLD high reflectors and subsequently characterized using optical microscopy, scanning electron microscopy, and energy dispersive x ray spectroscopy. Initial results suggest that higher concentrations are observed near the beamline ports from the target chambers.
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