Dr. Shuling Wang
at Siemens Digital Industries Software
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 28 April 2023 Poster + Paper
Proceedings Volume 12494, 1249417 (2023) https://doi.org/10.1117/12.2658320
KEYWORDS: SRAF, Printing, Stochastic processes, Modeling, Semiconducting wafers, Scanning electron microscopy, Extreme ultraviolet, Design and modelling, Data modeling, Photomasks

Proceedings Article | 16 September 2022 Paper
Proceedings Volume 12325, 1232506 (2022) https://doi.org/10.1117/12.2640532
KEYWORDS: SRAF, Semiconducting wafers, Stochastic processes, Data modeling, Scanning electron microscopy, Photomasks, Extreme ultraviolet, Calibration, Line width roughness

Proceedings Article | 22 February 2021 Presentation + Paper
Proceedings Volume 11609, 1160917 (2021) https://doi.org/10.1117/12.2583792

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