Dr. Stefan Majoni
at Philips GmbH
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 28 May 2004 Paper
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.544254
KEYWORDS: Photomasks, Lithography, Manufacturing, Nanoimprint lithography, Optical lithography, Phase shifts, Photoresist processing, Semiconducting wafers, Monochromatic aberrations, Semiconductors

Proceedings Article | 2 June 2003 Paper
Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.485025
KEYWORDS: Process control, Lithography, Metrology, Finite element methods, Inspection, Optical lithography, Safety, Single photon emission computed tomography

Proceedings Article | 26 April 2001 Paper
Bernd Tollkuehn, Max Hoepfl, Andreas Erdmann, Stefan Majoni, Marion Jess
Proceedings Volume 4404, (2001) https://doi.org/10.1117/12.425221
KEYWORDS: Data modeling, Diffusion, Lithography, Scanning electron microscopy, Calibration, Optimization (mathematics), Performance modeling, Critical dimension metrology, Computer simulations, Picture Archiving and Communication System

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