Dr. Stefano Selci Profile

Dr. Stefano Selci

Senior Scientist at Consiglio Nazionale delle Ricerche

SPIE Involvement:

Author

Publications (4)

SPIE Journal Paper | 22 May 2013

ELENA microchannel plate detector: absolute detection efficiency for low energy neutral atoms

Rosanna Rispoli, Elisabetta De Angelis, Luca Colasanti, Nello Vertolli, Stefano Orsini, Juergen Scheer, Alessandro Mura, Anna Milillo, Peter Wurz, Stefano Selci, Andrea Di Lellis, Roberto Leoni, Marco D'Alessandro, Francesco Mattioli, Sara Cibella

OE, Vol. 52, Issue 05, 051206, (May 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.5.051206

KEYWORDS: Microchannel plates, Sensors, Chemical species, Energy efficiency, Particles, Wind energy, Mercury (planet), Solar processes, Ions, Electrons

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Proceedings Article | 13 September 2012 Paper

ELENA MCP detector: absolute detection efficiency for low-energy neutral atoms

R. Rispoli, E. De Angelis, L. Colasanti, N. Vertolli, S. Orsini, J. Scheer, A. Mura, A. Milillo, P. Wurz, S. Selci, A. M. Di Lellis, R. Leoni, M. D'Alessandro, F. Mattioli, S. Cibella

Proceedings Volume 8450, 84505L (2012) https://doi.org/10.1117/12.926185

KEYWORDS: Microchannel plates, Sensors, Chemical species, Particles, Energy efficiency, Coating, Mercury (planet), Ions, Electrons, Calibration

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Proceedings Article | 7 October 2011 Paper

The Fabry-Pérot interferometer prototype for the ADAHELI solar small mission

Francesco Berrilli, Martina Cocciolo, Luca Giovannelli, Dario Del Moro, Fabio Giannattasio, Roberto Piazzesi, Marco Stangalini, Alberto Egidi, Fabio Cavallini, Vincenzo Greco, Stefano Selci

Proceedings Volume 8148, 814807 (2011) https://doi.org/10.1117/12.893552

KEYWORDS: Interferometers, Prototyping, Fabry–Perot interferometers, Actuators, Space telescopes, Satellites, Telescopes, Sensors, Channel projecting optics, Transparency

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Proceedings Article | 17 August 2004 Paper

Scanning diffraction microscopy: far-field microscopy by interferometry and diffraction combination

Stefano Selci

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545582

KEYWORDS: Diffraction, Microscopy, Interferometry, Superposition, Sensors, Image resolution, Copper, Optical microscopes, Modulation, Semiconductor lasers

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