Dr. Stéphanie Palmier Profile

Dr. Stéphanie Palmier

at Commissariat à l'Énergie Atomique

SPIE Involvement:

Author

Publications (12)

Proceedings Article | 29 November 2010 Paper

Mixed metal dielectric pulse compression gratings

J. Néauport, N. Bonod, S. Hocquet, S. Palmier, E. Lavastre, N. Baclet, G. Dupuy

Proceedings Volume 7842, 784209 (2010) https://doi.org/10.1117/12.866869

KEYWORDS: Laser damage threshold, Mirrors, Dielectrics, Laser development, Gold, Diffraction gratings, Manufacturing, Metals, Optical design, Silica

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Proceedings Article | 31 December 2009 Paper

Mixed metal dielectric gratings for pulse compression applications

J. Néauport, S. Palmier, N. Bonod, E. Lavastre, N. Baclet, G. Dupuy

Proceedings Volume 7504, 75040R (2009) https://doi.org/10.1117/12.836063

KEYWORDS: Diffraction gratings, Mirrors, Gold, Laser damage threshold, Optical design, Manufacturing, Reflectivity, Silica, Diffraction, Laser development

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Proceedings Article | 30 December 2008 Paper

Effect of the temporal pulse duration on the initiation of damage sites on fused silica surfaces

B. Bertussi, P. Cormont, S. Palmier, G. Gaborit, L. Lamaignere, P. Legros, J.-L. Rullier

Proceedings Volume 7132, 71320A (2008) https://doi.org/10.1117/12.804411

KEYWORDS: Silica, Excimer lasers, Confocal microscopy, Nd:YAG lasers, Raster graphics, High power lasers, Laser induced damage, Pulsed laser operation, Resonators, Mirrors

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Proceedings Article | 25 September 2008 Paper

Non-destructive evaluation on optical components for high power density applications

Jean-Yves Natoli, Frank Wagner, A. Ciapponi, S. Palmier, Laurent Gallais, Mireille Commandré

Proceedings Volume 7101, 710118 (2008) https://doi.org/10.1117/12.797485

KEYWORDS: Luminescence, Absorption, Coating, Laser induced damage, Silica, Interfaces, Gold, Laser damage threshold, Particles, Diagnostics

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Proceedings Article | 25 September 2008 Paper

Characterizations of UV-laser damage on fused silica surfaces

Philippe Cormont, Stéphanie Palmier, Bertrand Bertussi, Roger Courchinoux, Gael Gaborit, Laurent Gallais, Laurent Lamaignère, Philippe Legros, Jean-Luc Rullier, Hervé Bercegol

Proceedings Volume 7102, 71020U (2008) https://doi.org/10.1117/12.797407

KEYWORDS: Excimer lasers, Confocal microscopy, Pulsed laser operation, Nd:YAG lasers, Silica, Laser induced damage, Polishing, Excimers, Mirrors, Laser development

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SPIE Journal Paper | 1 August 2008

Method to characterize superficial particulate pollution and to evaluate its impact on optical components under a high power laser

Stéphanie Palmier, Séverine Garcia, Jean-Luc Rullier

OE, Vol. 47, Issue 08, 084203, (August 2008) https://doi.org/10.1117/12.10.1117/1.2969130

KEYWORDS: Particles, Pollution, Optical components, Silica, Laser induced damage, Scanning electron microscopy, High power lasers, Optical engineering, Laser irradiation, Mirrors

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Proceedings Article | 16 April 2008 Paper

Laser induced fluorescence as a tool for the study of laser damage precursors in transparent materials

Alessandra Ciapponi, Stéphanie Palmier, Frank Wagner, Jean-Yves Natoli, Herve Piombini, David Damiani, Bertrand Bertussi

Proceedings Volume 6998, 69981E (2008) https://doi.org/10.1117/12.780207

KEYWORDS: Luminescence, Crystals, Laser induced damage, Ultraviolet radiation, Laser damage threshold, Visible radiation, Absorption, Pulsed laser operation, Nonlinear crystals, National Ignition Facility

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Proceedings Article | 18 January 2007 Paper

Influence of artificial metallic defects size on the surface cleaning process

J. Capoulade, J. Natoli, S. Palmier, J. Rullier, I. Tovena

Proceedings Volume 6403, 64030G (2007) https://doi.org/10.1117/12.695454

KEYWORDS: Absorption, Aluminum, Silica, Particles, Laser induced damage, Microscopes, Profilometers, Laser optics, Nd:YAG lasers, Microscopy

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Proceedings Article | 18 January 2007 Paper

Surface particulate contamination of the LIL optical components and their evolution under laser irradiation

S. Palmier, S. Garcia, L. Lamaignère, M. Loiseau, T. Donval, J. Rullier, I. Tovena, L. Servant

Proceedings Volume 6403, 64030V (2007) https://doi.org/10.1117/12.695442

KEYWORDS: Particles, Silica, Optical components, Antireflective coatings, Pollution, Minerals, Contamination, Laser irradiation, Scanning electron microscopy, Laser induced damage

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Proceedings Article | 28 April 2006 Paper

Characterization of particle contamination for optical application

I. Tovena, S. Palmier, S. Garcia, P. Manac'h, E. Sellier

Proceedings Volume 6188, 61881H (2006) https://doi.org/10.1117/12.661621

KEYWORDS: Particles, Particle contamination, Silica, Scanning electron microscopy, Optical filters, Control systems, Silicon, Particle filters, Gold, Contamination control

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Proceedings Article | 7 February 2006 Paper

Study of laser interaction with aluminum contaminant on fused silica

S. Palmier, I. Tovena, L. Lamaignère, J.L. Rullier, J. Capoulade, B. Bertussi, J.Y. Natoli, L. Servant

Proceedings Volume 5991, 59910R (2006) https://doi.org/10.1117/12.639141

KEYWORDS: Aluminum, Silica, Absorption, Microscopy, Laser induced damage, Optical lithography, Microscopes, High power lasers, Contamination, Particles

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Proceedings Article | 21 February 2005 Paper

Laser damaged optics induced by chromium particle contamination

Stephanie Palmier, Isabelle Tovena, Roger Courchinoux, Michel Josse, Jean Luc Rullier, Bertrand Bertussi, Jean Yves Natoli, Laurent Servant, David Talaga

Proceedings Volume 5647, (2005) https://doi.org/10.1117/12.585248

KEYWORDS: Chromium, Silica, Absorption, Contamination, Laser induced damage, Atomic force microscopy, Particles, Laser optics, Optical components, Microscopes

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Showing 5 of 12 publications

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